전남대학교 중앙도서관

Notice of Removal: Dissolution of oxygen precipitate nuclei in N-type CZ Si wafers to improve their material quality: Experimental results

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issue: 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2017 IEEE 44th. :1-3 Jun, 2017
Author: Sopori, Bhushan
Devayajanam, Srinivas
Basnyat, Prakash
Tan, Teh
Upadhyaya, Ajay
Rohatgi, Ajeet
Xu, Han
DB Label: Database : IEEE Xplore Digital Library

Using minority carrier lifetime measurement to determine saw damage characteristics on Si wafer surfaces

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issue: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-6 Jun, 2015
Author: Sopori, Bhushan
Devayajanam, Srinivas
Basnyat, Prakash
DB Label: Database : IEEE Xplore Digital Library

Analyses of diamond wire sawn wafers: Effect of various cutting parameters

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issue: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-6 Jun, 2015
Author: Sopori, Bhushan
Basnyat, Prakash
Devayajanam, Srinivas
Schnepf, Rekha
Sahoo, Santosh
Gee, James
Severico, Ferdinando
Manens, Antoine
Seigneur, Hubert
Schoenfeld, Winston V.
Preece, Steve
DB Label: Database : IEEE Xplore Digital Library

Bulk defect generation during B-diffusion and oxidation of CZ wafers: Mechanism for degrading solar cell performance

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issue: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th. :0719-0723 Jun, 2014
Author: Sopori, Bhushan
Yuan, Hao-Chih
Devayajanam, Srinivas
Basnyat, Prakash
LaSalvia, Vincenzo
Norman, Andrew
Page, Matt
Nemeth, Bill
Stradins, Paul
DB Label: Database : IEEE Xplore Digital Library

Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

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issue: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th. :0649-0654 Jun, 2014
Author: Sopori, Bhushan
Devayajanam, Srinivas
Basnyat, Prakash
Moutinho, Helio
Nemeth, Bill
LaSalvia, Vincenzo
Johnston, Steve
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

Effect of SiO2 passivation on CdTe based solar cells

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issue: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2015 IEEE 42nd. :1-3 Jun, 2015
Author: Budhraja, Vinay
Devayajanam, Srinivas
DB Label: Database : IEEE Xplore Digital Library

Defect mapping and stress mapping of crystalline silicon using Spectroscopic Ellipsometry

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issue: 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th. :0212-0217 Jun, 2013
Author: Seal, Sayan
Budhraja, Vinay
Sopori, Bhushan
Devayajanam, Srinivas
Basnyat, Prakash
Varadan, Vasundara V.
DB Label: Database : IEEE Xplore Digital Library

Online monitoring for Si solar cell manufacturing

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issue: 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th. :0939-0944 Jun, 2013
Author: Sopori, Bhushan
Devayajanam, Srinivas
Rivero, Rene
Rupnowski, Peter
DB Label: Database : IEEE Xplore Digital Library

Characterizing damage on Si wafer surfaces cut by slurry and diamond wire sawing

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issue: 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th. :0945-0950 Jun, 2013
Author: Sopori, Bhushan
Devayajanam, Srinivas
Shet, Sudhakar
Guhabiswas, Debraj
Basnyat, Prakash
Moutinho, Helio
Gedvilas, Lynn
Jones, Kim
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

Understanding light-induced degradation of c-Si solar cells

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issue: 2012 38th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE. :001115-001120 Jun, 2012
Author: Sopori, Bhushan
Basnyat, Prakash
Devayajanam, Srinivas
Shet, Sudhakar
Mehta, Vishal
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

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