전남대학교 중앙도서관

Minority carrier traps in Czochralski-grown p-type silicon crystals doped with B, Al, Ga, or In impurity atoms

회의자료

issue: 2020 47th IEEE Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2020 47th IEEE. :1013-1018 Jun, 2020
Author: De Guzman, Joyce Ann T.
Markevich, Vladimir P.
Hammersley, Simon
Hawkins, Ian D.
Crowe, Iain
Abrosimov, Nikolay V.
Falster, Robert
Binns, Jeff
Altermatt, Pietro
Halsall, Matthew P.
Peaker, Anthony R.
DB Label: Database : IEEE Xplore Digital Library

Some challenges in making accurate and reproducible measurements of minority carrier lifetime in high-quality Si wafers

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issue: 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Photovoltaic Specialist Conference (PVSC), 2014 IEEE 40th. :0649-0654 Jun, 2014
Author: Sopori, Bhushan
Devayajanam, Srinivas
Basnyat, Prakash
Moutinho, Helio
Nemeth, Bill
LaSalvia, Vincenzo
Johnston, Steve
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

Characterizing damage on Si wafer surfaces cut by slurry and diamond wire sawing

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issue: 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC) Photovoltaic Specialists Conference (PVSC), 2013 IEEE 39th. :0945-0950 Jun, 2013
Author: Sopori, Bhushan
Devayajanam, Srinivas
Shet, Sudhakar
Guhabiswas, Debraj
Basnyat, Prakash
Moutinho, Helio
Gedvilas, Lynn
Jones, Kim
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

Understanding light-induced degradation of c-Si solar cells

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issue: 2012 38th IEEE Photovoltaic Specialists Conference Photovoltaic Specialists Conference (PVSC), 2012 38th IEEE. :001115-001120 Jun, 2012
Author: Sopori, Bhushan
Basnyat, Prakash
Devayajanam, Srinivas
Shet, Sudhakar
Mehta, Vishal
Binns, Jeff
Appel, Jesse
DB Label: Database : IEEE Xplore Digital Library

The measurement of ultra low uniform corrosion rates

학술저널

issue: In Corrosion Science November 2020 176
Author: Senior, Nicholas A. ^*
Martino, Taylor
Diomidis, Nikitas
Gaggiano, Roberto
Binns, Jeff
Keech, Peter
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Deep-level defects in Ga-doped silicon crystals.

회의자료

issue: AIP Conference Proceedings; 2023, Vol. 2826 Issue 1, p1-10, 10p
Author: Fattah, Tarek O. Abdul
Markevich, Vladimir P.
De Guzman, Joyce Ann
Coutinho, José
Abrosimov, Nikolay V.
Binns, Jeff
Crowe, Iain
Halsall, Matthew P.
Peaker, Anthony R.
DB Label: Database : Complementary Index

Acceptor-oxygen defects in silicon: The electronic properties of centers formed by boron, gallium, indium, and aluminum interactions with the oxygen dimer.

학술저널

issue: Journal of Applied Physics; 12/28/2021, Vol. 130 Issue 24, p1-9, 9p
Author: de Guzman, Joyce Ann T.
Markevich, Vladimir P.
Hawkins, Ian D.
Coutinho, José
Ayedh, Hussein M.
Binns, Jeff
Abrosimov, Nikolay V.
Lastovskii, Stanislau B.
Crowe, Iain F.
Halsall, Matthew P.
Peaker, Anthony R.
DB Label: Database : Complementary Index

원문보기: Full Text (AIP) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Surface Damage Introduced by Diamond Wire Sawing of Si Wafers: Measuring in-depth and the Lateral Distributions for Different Cutting Parameters

학술저널

issue: MRS Online Proceedings Library. 1770(1):61-66
Author: Sopori, Bhushan
Devayajanam, Srinivas^{Aff1, Aff2}
Basnyat, Prakash^{Aff1, Aff2}
Schnepf, Rekha
Sahoo, Santosh^{Aff1, Aff2}
Gee, James
Severico, Ferdinando
Seigneur, Hubert
Schoenfeld, Winston V.
Preece, Steve
Binns, Jeff
Appel, Jesse
VanSant, Kaitlyn
DB Label: Database : Springer Nature Journals

Thermally Constrained Conceptual Deep Geological Repository Design under Spacing and Placing Uncertainties

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A Comparison of Surface Passivation Techniques for Measurement of Minority Carrier Lifetime in Thin Si Wafers: Toward a Stable and Uniform Passivation

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