Surface and thin film analysis a compendium of principles, instrumentation, and applications/ 2nd completely rev. and enlarged ed

상세정보

자료유형	단행본
서명/저자사항	Surface and thin film analysis : a compendium of principles, instrumentation, and applications/ edited by Gernot Friedbacher and Henning Bubert.
개인저자	Friedbacher, Gernot.  Bubert, H.  (Henning)
판사항	2nd completely rev. and enlarged ed.
발행사항	Weinheim: Wiley-VCH, c2011.
형태사항	xxiv, 533 p.: ill.; 25 cm.
ISBN	9783527320479 (hbk.): 3527320474
일반주기	Formerly CIP. Uk
서지주기	Includes bibliographical references and index.
내용주기	INTRODUCTION ELECTRON DETECTION Photoelectron Spectroscopy (XPS, UPS) Auger Electron Spectroscopy (AES, SAM) Electron Energy Loss Spectroscopy (EELS) Low-energy Electron Diffraction (LEED) ION DETECTION Static Secondary Ion Mass Spectrometry (SSIMS) Dynamic Secondary Ion Mass Spectrometry (SIMS) Electron Beam and HF-Plasma Secondary Neutral Mass Spectrometry (SNMS) Laser-SNMS Rutherford Backscattering Spectroscopy (RBS) Low Energy Ion Scattering (LEIS) Nuclear Reaction Analysis (NRA) PHOTON DETECTION Total Reflection X-Ray Fluorescence Analysis (TXRF) Energy-dispersive X-ray Spectroscopy (EDXS) Grazing Incidence X-Ray Methods for Near-surface Structural Studies Glow Discharge Optical Emission Spectroscopy (GD-OES) Surface Analysis by Laser Ablation Ion Beam Spectrochemical Analysis (IBSCA) Reflection Absorption IR Spectroscopy (RAIRS) Surface-enhanced Raman Scattering (SERS) UV/VIS/IR Ellipsometry (ELL) SCANNING MICROSCOPY Atomic Force Microscopy (AFM) Scanning Tunneling Microscopy (STM) MISCELLANEOUS LEEM TXRF-NEXAFS GIXRF-NEXAFS SNOM EF-TEM SFG SHG FIM/AP SUMMARY AND COMPARISON OF TECHNIQUES SURFACE ANALYTICAL EQUIPMENT SUPPLIERS REFERENCES
요약	Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology.
일반주제명	Thin films -- Surfaces -- Analysis.
분류기호(DDC)	530.4275
언어	영어