자료유형 | e-Book |
---|---|
서명/저자사항 | Semiconductor material and device characterization [electronic resource] / Dieter K. Schroder. |
개인저자 | Schroder, Dieter K. |
단체저자명 | John Wiley & Sons, Inc. |
판사항 | 3rd ed. |
발행사항 | New York. Hoboken, N.J.: John Wiley, 2006. |
형태사항 | 1 online resource(xv, 779 p.). |
ISBN | 9780471749097 (electronic bk.) 9780470362501 |
일반주기 |
"Wiley-Interscience."
|
서지주기 | Includes bibliographical references and index. |
요약 | The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including |
복제주기 | Electronic reproduction Somerset, New Jersey: Wiley InterScience, 2004. Available via World Wide Web |
일반주제명 | Semiconductors. Semiconductors --Testing. |
분류기호(DDC) | 621.38152 |
언어 | 영어 |
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1 | E152611 | EB 621.38152 | 중앙도서관[본관]/E-Book/ | 대출가능 |