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1

회의자료

issue
2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :10.2.1-10.2.4 Dec, 2022
Author
Hu, G.
Safranski, C.
Sun, J. Z.
Hashemi, P.
Brown, S. L.
Bruley, J.
Buzi, L.
D'Emic, C. P.
Galligan, E.
Gottwald, M. G.
Gunawan, O.
Lee, J.
Karimeddiny, S.
Trouilloud, P. L.
Worledge, D. C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
2

회의자료

issue
2022 IEEE 33rd Magnetic Recording Conference (TMRC) Magnetic Recording Conference (TMRC), 2022 IEEE 33rd. :1-2 Aug, 2022
Author
Worledge, D. C.
Safranski, C.
Hu, G.
Sun, J. Z.
Hashemi, P.
Brown, S. L.
Buzi, L.
D'Emic, C. P.
Gottwald, M. G.
Gunawan, O.
Jung, H.
Karimeddiny, S.
Kim, J.
Trouilloud, P. L.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :288-289 Jun, 2022
Author
Safranski, C.
Hu, G.
Sun, J. Z.
Hashemi, P.
Brown, S. L.
Buzi, L.
D'Emic, C. P.
Edwards, E. R. J.
Galligan, E.
Gottwald, M. G.
Gunawan, O.
Karimeddiny, S.
Jung, H.
Kim, J.
Latzko, K.
Trouilloud, P. L.
Zare, S.
Worledge, D. C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

학술저널

issue
MRS Advances. 8(5):131-137
Author
Worledge, D. C.Aff1, IDs4358002300538w_cor1
Hu, G.
DB Label
Database : Springer Nature Journals
원문보기
5

회의자료

issue
2021 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2021 IEEE International. :2.5.1-2.5.4 Dec, 2021
Author
Hu, G.
Lauer, G.
Sun, J. Z.
Hashemi, P.
Safranski, C.
Brown, S. L.
Buzi, L.
Edwards, E. R. J.
D'Emic, C. P.
Galligan, E.
Gottwald, M. G.
Gunawan, O.
Jung, H.
Kim, J.
Latzko, K.
Nowak, J. J.
Trouilloud, P. L.
Zare, S.
Worledge, D. C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :24.4.1-24.4.4 Dec, 2020
Author
Edwards, E. R. J.
Hu, G.
Brown, S. L.
D'Emic, C. P.
Gottwald, M. G.
Hashemi, P.
Jung, H.
Kim, J.
Lauer, G.
Nowak, J. J.
Sun, J. Z.
Suwannasiri, T.
Trouilloud, P. L.
Woo, S.
Worledge, D. C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2017 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) VLSI Design, Automation and Test (VLSI-DAT), 2017 International Symposium on. :1-2 Apr, 2017
Author
Hu, G.
Nowak, J. J.
Lauer, G.
Lee, J. H.
Sun, J. Z.
Harms, J.
Annunziata, A.
Brown, S.
Chen, W.
Kim, Y. H.
Marchack, N.
Murthy, S.
Kothandaraman, C.
O'Sullivan, E. J.
Park, J. H.
Reuter, M.
Robertazzi, R. P.
Trouilloud, P. L.
Zhu, Y.
Worledge, D. C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
69th Device Research Conference Device Research Conference (DRC), 2011 69th Annual. :171-174 Jun, 2011
Author
Sun, J. Z.
Robertazzi, R. P.
Nowak, J. J.
Trouilloud, P. L.
Hu, G.
Gaidis, M. C.
Brown, S. L.
Abraham, D. W.
O'Sullivan, E. J.
Gallagher, W. J.
Worledge, D. C.
Kent, A. D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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