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전체선택

Highly Tunable Piezoelectric Resonators Using Al0.7Sc0.3N

학술저널

issue: Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 33(2):121-123 Apr, 2024
Author: Izhar, .
Deng, Y.
Fiagbenu, M.M.A.
Kochhar, A.
Vetury, R.
Olsson, R.H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

X-band Bulk Acoustic Wave Resonator (XBAW) using Periodically Polarized Piezoelectric Films (P3F)

회의자료

issue: 2023 IEEE International Ultrasonics Symposium (IUS) Ultrasonics Symposium (IUS), 2023 IEEE International. :1-4 Sep, 2023
Author: Kochhar, A.
Vetury, R.
Leathersich, J.
Schaffer, Z.
Moe, C.
Kim, D.
Cheema, K.
Winters, M.
Shealy, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A K-Band Bulk Acoustic Wave Resonator Using Periodically Poled Al0.72Sc0.28N

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(7):1196-1199 Jul, 2023
Author: Izhar, .
Fiagbenu, M.M.A.
Musavigharavi, P.
Du, X.
Leathersich, J.
Moe, C.
Kochhar, A.
Stach, E.A.
Vetury, R.
Olsson, R.H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

452 MHz Bandwidth, High Rejection 5.6 GHz UNII XBAW Coexistence Filters Using Doped AlN-on-Silicon

회의자료

issue: 2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :17.6.1-17.6.4 Dec, 2019
Author: Shen, Y.
Patel, P.
Vetury, R.
Shealy, J.B.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Characterization of AlGaN/GaN HEMTs Using Gate Resistance Thermometry

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(1):78-83 Jan, 2017
Author: Pavlidis, G.
Pavlidis, S.
Heller, E.R.
Moore, E.A.
Vetury, R.
Graham, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A manufacturable, high power RF Gallium Nitride (GaN) technology portfolio with 65V operation and enhanced linearity

회의자료

issue: 2011 IEEE International Conference on Microwaves, Communications, Antennas and Electronic Systems (COMCAS 2011) Microwaves, Communications, Antennas and Electronics Systems (COMCAS), 2011 IEEE International Conference on. :1-8 Nov, 2011
Author: Shealy, J. B.
Vetury, R.
Trabert, B.
Runton, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A 0.1-1.8 GHz, 100 W GaN HEMT Power Amplifier Module

회의자료

issue: 2010 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS) Compound Semiconductor Integrated Circuit Symposium (CSICS), 2010 IEEE. :1-4 Oct, 2010
Author: Krishnamurthy, K.
Lieu, D.
Vetury, R.
Martin, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

100 W GaN HEMT power amplifier module with > 60% efficiency over 100–1000 MHz bandwidth

회의자료

issue: 2010 IEEE MTT-S International Microwave Symposium Microwave Symposium Digest (MTT), 2010 IEEE MTT-S International. :940-943 May, 2010
Author: Krishnamurthy, K.
Driver, T.
Vetury, R.
Martin, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Thermometry of AlGaN/GaN HEMTs Using Multispectral Raman Features

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(6):1898-1904 Jun, 2013
Author: Choi, S.
Heller, E. R.
Dorsey, D.
Vetury, R.
Graham, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

High Power, High Efficiency, AlGaN/GaN HEMT Technology for Wireless Base Station Applications

회의자료

issue: IEEE MTT-S International Microwave Symposium Digest, 2005. Microwave Symposium Microwave Symposium Digest, 2005 IEEE MTT-S International. :487-490 Jun, 2005
Author: Vetury, R.
Wei, Y.
Green, D.S.
Gibb, S.R.
Mercier, T.W.
Leverich, K.
Garber, P.M.
Poulton, M.J.
Shealy, J.B.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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