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1
EMC Testing of Electricity Meters Using Real-World and Artificial Current Waveforms 미리보기

학술저널

issue
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 63(6):1865-1874 Dec, 2021
Author
van den Brom, H.E.
van Leeuwen, R.
Marais, Z.
ten Have, B.
Hartman, T.
Azpurua, M.
Pous, M.
Kok, G.
van Veghel, M.
Kolevatov, I.
Malmbekk, H.
Silva, F.
Leferink, F.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
2
Reduction of Static Electricity Meter Errors by Broadband Compensation of Voltage and Current Channel Differences 미리보기

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-11 2021
Author
Marais, Z.
van den Brom, H.E.
Kok, G.
van Veghel, M.G.A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
3
Voltage Dependence of the Reference System in Medium- and High-Voltage Current Transformer Calibrations 미리보기

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-8 2021
Author
van den Brom, H.E.
van Leeuwen, R.
Rietveld, G.
Houtzager, E.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
4
Sensitivity of static energy meter reading errors to changes in non-sinusoidal load conditions 미리보기

회의자료

issue
2019 International Symposium on Electromagnetic Compatibility - EMC EUROPE Electromagnetic Compatibility - EMC EUROPE, 2019 International Symposium on. :202-207 Sep, 2019
Author
Marais, Z.
van den Brom, H.E.
Rietveld, G.
van Leeuwen, R.
Hoogenboom, D.
Rens, J.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
5
An Optoelectronic Pulse Drive for Quantum Voltage Synthesizer 미리보기

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issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(6):2066-2071 Jun, 2019
Author
Ireland, J.
Williams, J.
Kieler, O.
Behr, R.
Houtzager, E.
Hornecker, R.
van den Brom, H.E.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
6
Characterization of DC Current Sensors With AC Distortion for Railway Applications 미리보기

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(6):2084-2090 Jun, 2019
Author
van den Brom, H.E.
van Leeuwen, R.
Hornecker, R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
7
Measurement Methods and Procedures for Assessing Accuracy of Instrument Transformers for Power Quality Measurements 미리보기

회의자료

issue
2020 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2020 Conference on. :1-2 Aug, 2020
Author
Crotti, G.
van den Brom, H.E.
Mohns, E.
Tinarelli, R.
Luiso, M.
Styblikova, R.
Agazar, M
Cayci, H.
Mazza, P.
Meyer, J.
Almutairi, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
8
Towards improved standardization of electricity meter testing 미리보기

회의자료

issue
2020 Conference on Precision Electromagnetic Measurements (CPEM) Precision Electromagnetic Measurements (CPEM), 2020 Conference on. :1-2 Aug, 2020
Author
van den Brom, H.E.
Rietveld, G.
Hoogenboom, D.
van Leeuwen, R.
Marais, Z.
Kok, G.J.P.
Sharma, S.
van Veghel, M.G.A.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
9
Measurement of the harmonic impedance of the aggregated distribution network 미리보기

회의자료

issue
2016 17th International Conference on Harmonics and Quality of Power (ICHQP) Harmonics and Quality of Power (ICHQP), 2016 17th International Conference on. :739-744 Oct, 2016
Author
Cuk, V.
Ni, F.
Jin, W.
Jongepier, A.
van den Brom, H.E.
Rietveld, G.
Acanski, M.
Cobben, J.F.G.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
10
AC–DC Calibrations With a Pulse-Driven AC Josephson Voltage Standard Operated in a Small Cryostat 미리보기

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 66(6):1391-1396 Jun, 2017
Author
van den Brom, H.E.
Kieler, O.F.O.
Bauer, S.
Houtzager, E.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
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