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1

회의자료

issue
2024 40th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2024 40th. :1-5 Mar, 2024
Author
Minazzo, Enzo
Thome, John R.
Marcinichen, Jackson B.
Ahearne, Sean
Buining, Fred
Rommel, Simon
Cimoli, Bruno
Monroy, Idelfonso Tafur
Lazanyi, Janos
Fleuren, Mark
DB Label
Database : IEEE Xplore Digital Library
원문보기
2

회의자료

issue
2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2023 22nd IEEE Intersociety Conference on. :1-5 May, 2023
Author
Seuret, Andre
Marcinichen, Jackson B.
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2023 22nd IEEE Intersociety Conference on. :1-5 May, 2023
Author
Minazzo, Enzo M.
Rouaze, Gautier
Marcinichen, Jackson B.
Thome, John R.
Xiong, Kangning
Zhang, L. Winston
Pohl, Wilhelm
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2022 21st IEEE Intersociety Conference on. :1-9 May, 2022
Author
Minazzo, Enzo M.
Rouaze, Gautier
Marcinichen, Jackson B.
Thome, John R.
Zhang, L. Winston
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2022 21st IEEE Intersociety Conference on. :1-6 May, 2022
Author
Amalfi, Raffaele L.
Hoang, Cong H.
Enright, Ryan
Kim, John
Cataldo, Filippo
Marcinichen, Jackson B.
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2022 21st IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2022 21st IEEE Intersociety Conference on. :1-8 May, 2022
Author
Rouaze, Gautier
Marcinichen, Jackson B.
Thome, John R.
Xiong, Kangning
Zhang, L. Winston
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2021 20th IEEE Intersociety Conference on. :518-523 Jun, 2021
Author
Cataldo, Filippo
Crea, Yuri C.
Amalfi, Raffaele L.
Marcinichen, Jackson B.
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2021 20th IEEE Intersociety Conference on. :402-409 Jun, 2021
Author
Haynau, Remy
Marcinichen, Jackson Braz
Amalfi, Raffaele L.
Cataldo, Filippo
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2021 20th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm) Thermal and Thermomechanical Phenomena in Electronic Systems (iTherm), 2021 20th IEEE Intersociety Conference on. :423-430 Jun, 2021
Author
Amalfi, Raffaele L.
Faraldo, Francois P.
Salamon, Todd
Enright, Ryan
Cataldo, Filippo
Marcinichen, Jackson B.
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2020 19th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2020 19th IEEE Intersociety Conference on. :402-409 Jul, 2020
Author
Amalfi, Raffaele L.
Cataldo, Filippo
Marcinichen, Jackson B.
Thome, John R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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