전남대학교 중앙도서관

링크메뉴

주메뉴

- 게시판
- 전시마당

- 게시판
- 전시마당

- 대출반납서비스
- 도서신청서비스
- 시설이용서비스
- 장애학생 지원서비스
- 타기관이용서비스
- 무인예약대출 서비스
- 학위논문파일 제출
- 개인정보관리
- 원문복사 신청/조회
- 상호대차 신청/조회
- 게시판
- 전시마당

도서관안내
시설안내
정보마루안내
4F
전자자료 상세검색

전자자료 상세검색

통합검색
소장자료
전자자료

통합검색

결과내 검색

검색어 [키워드: "Tartarin, J.G."]

총 56건

※ 중복 레코드가 제거된 검색 결과가 표시됩니다.

1/6 페이지

검색결과수정

검색범위확장
- Full Text내 키워드 확장
- 관련 주제어 확장
재검색
검색결과제한
- 원문(Full Text)
- Peer-Reviewed 학술지
- 발행년 -
재검색
자료유형
- Conference Materials (35)
- Academic Journals (21)
주제
- components, circuits, devices and systems (17)
- gallium nitride (13)
- fields, waves and electromagnetics (11)
주제

Count Name
- components, circuits, devices and systems (17)
- gallium nitride (13)
- fields, waves and electromagnetics (11)
- hemts (10)
- photonics and electrooptics (10)
- low-frequency noise (9)
- stress (9)
- engineered materials, dielectrics and plasmas (8)
- communication, networking and broadcast technologies (7)
- aluminum gallium nitride (6)
- degradation (6)
- germanium silicon alloys (5)
- heterojunction bipolar transistors (5)
- logic gates (5)
- modfets (5)
- modulation-doped field-effect transistors (5)
- radio frequency (5)
- silicon germanium (5)
- temperature (5)
- aerospace (4)
- gan hemt (4)
- hot carriers (4)
- noise measurement (4)
- reliability (4)
- signal processing and analysis (4)
- current measurement (3)
- electron traps (3)
- gallium arsenide (3)
- gate array circuits (3)
- life testing (3)
- low frequency noise (3)
- temperature measurement (3)
- algan/gan hemt (2)
- bicmos integrated circuits (2)
- chemical vapor deposition (2)
- computing and processing (2)
- deuterium (2)
- engineering profession (2)
- frequency (2)
- frequency measurement (2)
- hot carrier effects (2)
- low-noise amplifiers (2)
- microwave devices (2)
- microwave transistors (2)
- noise figure (2)
- passivation (2)
- phase noise (2)
- schottky barrier diodes (2)
- schottky diodes (2)
- semiconductor device reliability (2)
닫기
간행물
- microelectronics reliability (14)
- mrs online proceedings library (4)
- 1999 symposium on high performance electron devices for microwave & optoelectronic applications edmo (cat no99th8401) (1)
간행물

Count Name
- microelectronics reliability (14)
- mrs online proceedings library (4)
- 1999 symposium on high performance electron devices for microwave & optoelectronic applications edmo (cat no99th8401) (1)
- 1999 symposium on high performance electron devices for microwave and optoelectronic applications. edmo (cat. no.99th8401), high performance electron devices for microwave and optoelectronic applications, 1999. edmo. 1999 symposium on, high performance electron devices for microwave and optoelectronic applications (1)
- 2001 gaas reliability workshop. proceedings (ieee cat. no.01th8602) (1)
- 2001 gaas reliability workshop. proceedings (ieee cat. no.01th8602), gaas reliability workshop, 2001. proceedings, gaas reliability workshop (1)
- 2001 topical meeting on silicon monolithic integrated circuits in rf systems. digest of papers (ieee cat. no.01ex496) (1)
- 2001 topical meeting on silicon monolithic integrated circuits in rf systems. digest of papers (ieee cat. no.01ex496), silicon monolithic integrated circuits in rf systems, 2001. digest of papers. 2001 topical meeting on, silicon monolithic integrated circuits in rf systems (1)
- 2006 ieee mtt-s international microwave symposium digest (9780780375420) (1)
- 2006 ieee mtt-s international microwave symposium digest, microwave symposium digest, 2006. ieee mtt-s international (1)
- 2008 conference on optoelectronic & microelectronic materials & devices (1)
- 2008 conference on optoelectronic and microelectronic materials and devices, optoelectronic and microelectronic materials and devices, 2008. commad 2008. conference on (1)
- 2008 european microwave integrated circuit conference (1)
- 2008 european microwave integrated circuit conference, microwave integrated circuit conference, 2008. eumic 2008. european (1)
- 2011 21st international conference on noise & fluctuations (icnf) (1)
- 2011 21st international conference on noise and fluctuations, noise and fluctuations (icnf), 2011 21st international conference on (1)
- 2013 european microwave integrated circuit conference (1)
- 2013 european microwave integrated circuit conference, microwave integrated circuits conference (eumic), 2013 european (1)
- 2015 ieee mtt-s international microwave symposium (1)
- 2015 ieee mtt-s international microwave symposium, microwave symposium (ims), 2015 ieee mtt-s international (1)
- 2016 46th european microwave conference (eumc), microwave conference (eumc), 2016 46th european (1)
- 2017 international conference on noise and fluctuations (icnf), noise and fluctuations (icnf), 2017 international conference on (1)
- 2018 13th european microwave integrated circuits conference (eumic), european microwave integrated circuits conference (eumic), 2018 13th (1)
- 2018 19th ieee mediterranean electrotechnical conference (melecon), electrotechnical conference (melecon), 2018 19th ieee mediterranean (1)
- 2023 ieee international reliability physics symposium (irps), reliability physics symposium (irps), 2023 ieee international (1)
- 28th european solid-state device research conference (1)
- 28th european solid-state device research conference, solid-state device research conference, 1998. proceeding of the 28th european (1)
- 8th ieee international symposium on high performance electron devices for microwave & optoelectronic applications (cat. no.00th8534) (1)
- 8th ieee international symposium on high performance electron devices for microwave and optoelectronic applications (cat. no.00th8534), high performance electron devices for microwave and optoelectronic applications, 2000 8th ieee international symposium on, high performance electron devices for microwave and optoelectronic applications (1)
- ieee microwave & guided wave letters (1)
- ieee microwave and guided wave letters, microwave and guided wave letters, ieee, ieee microw. guid. wave lett. (1)
- ieee mtt/ed/ap/leo societies joint chapter united kingdom & republic of ireland section 1997 workshop on high performance electron devices for microwave & optoelectronic applications edmo (cat (1)
- ieee mtt/ed/ap/leo societies joint chapter united kingdom and republic of ireland section. 1997 workshop on high performance electron devices for microwave and optoelectronic applications. edmo (cat., high performance electron devices for microwave and optoelectronic applications, 1997. edmo. 1997 workshop on, high performance electron devices for microwave and optoelectronic applications (1)
- ieee transactions on electron devices, electron devices, ieee transactions on, ieee trans. electron devices (1)
- ieee transactions on microwave theory and techniques, microwave theory and techniques, ieee transactions on, ieee trans. microwave theory techn. (1)
- microwave integrated circuits conference (eumic), 2010 european (1)
- microwave integrated circuits conference (eumic), 2011 european (1)
- proceedings of edmo '96 (1)
- proceedings of edmo '96, high performance electron devices for microwave and optoelectronic applications workshop, 1996. edmo, high performance electron devices for microwave and optoelectronic applications (1)
- solid state electronics (1)
닫기
출판사
- ieee (33)
- elsevier b.v. (8)
- elsevier ltd (7)
출판사

Count Name
- ieee (33)
- elsevier b.v. (8)
- elsevier ltd (7)
- cambridge university press (2)
- european microwave association (2)
- springer international publishing (2)
- editions frontieres (1)
- european microwave association - euma (1)
닫기
언어
- english (35)
Publication Year
- 2023 (2)
- 2012 (1)
- 2013 (1)
Publication Year

Count Name
- 2023 (2)
- 2012 (1)
- 2013 (1)
- 2015 (1)
- 2017 (1)
- 2019 (1)
- 2020 (1)
닫기
수록데이터베이스
- IEEE Xplore Digital Library (21)
- Complementary Index (18)
- Academic Search Complete (8)
수록데이터베이스

Count Name
- IEEE Xplore Digital Library (21)
- Complementary Index (18)
- Academic Search Complete (8)
- ScienceDirect (7)
- Springer Nature Journals (2)
닫기

PQDT
CAJ
RISS
PsycINFO

전체선택

Thermal and statistical analysis of various AlN/GaN HEMT geometries for millimeter Wave applications

회의자료

issue: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Author: Said, N.
Harrouche, K.
Medjdoub, F.
Labat, N.
Tartarin, J.G.
Malbert, N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Fully Automated RF-Thermal Stress Workbench with S-Parameters Tracking for GaN Reliability Analysis

회의자료

issue: 2018 13th European Microwave Integrated Circuits Conference (EuMIC) European Microwave Integrated Circuits Conference (EuMIC), 2018 13th. :17-20 Sep, 2018
Author: Saugnon, D.
Tartarin, J.G.
Franc, B.
Maher, H.
Boone, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Impact of the Frequency Dependence of the Parasitic Admittance on the Diffusion Noise of a Diode Junction at Low Bias

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(12):5289-5294 Dec, 2019
Author: Graffeuil, J.
Escotte, L.
Tartarin, J.G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Impact of RF stress on different topologies of 100 nm X-band robust GaN LNA

학술저널

issue: In Microelectronics Reliability November 2023 150
Author: Pinault, B.
Tartarin, J.G.
Saugnon, D.
Leblanc, R.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Role of AlGaN back-barrier in enhancing the robustness of ultra-thin AlN/GaN HEMT for mmWave applications

학술저널

issue: In Microelectronics Reliability November 2023 150
Author: Said, N.
Harrouche, K.
Medjdoub, F.
Labat, N.
Tartarin, J.G.
Malbert, N.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Methodology for accurate diagnostic of defects in III-N HEMT technologies: Non-destructive and destructive experimental tools — Electrical and T-CAD models

회의자료

issue: 2018 19th IEEE Mediterranean Electrotechnical Conference (MELECON) Electrotechnical Conference (MELECON), 2018 19th IEEE Mediterranean. :237-242 May, 2018
Author: Tartarin, J.G.
Saugnon, D.
Graffeuil, J.
Bary, L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Understanding traps locations and impact on AlGaN/GaN HEMT by LFN noise & transient measurements, and T-CAD simulations

회의자료

issue: 2017 International Conference on Noise and Fluctuations (ICNF) Noise and Fluctuations (ICNF), 2017 International Conference on. :1-4 Jun, 2017
Author: Tartarin, J.G.
Saugnon, D.
Lazar, O.
Maillot, G.
Bary, L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Self-biasing effects induced by RF step-stress in Ka-band LNAs based on InAlN/GaN HEMT technology

회의자료

issue: 2016 46th European Microwave Conference (EuMC) Microwave Conference (EuMC), 2016 46th European. :1409-1412 Oct, 2016
Author: Tartarin, J.G.
Nsele, S.D.
Piotrowicz, S.
Delage, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

New approach for an accurate Schottky Barrier Height's extraction by I-V-T measurements

회의자료

issue: 2015 IEEE MTT-S International Microwave Symposium Microwave Symposium (IMS), 2015 IEEE MTT-S International. :1-4 May, 2015
Author: Lazar, O.
Tartarin, J.G.
Lambert, B.
Moreau, C.
Roux, J.L.
Muraro, J.L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Analysis of barrier inhomogeneities in AlGaN/GaN HEMTs' Schottky diodes by I-V-T measurements

회의자료

issue: 2013 European Microwave Integrated Circuit Conference Microwave Integrated Circuits Conference (EuMIC), 2013 European. :240-243 Oct, 2013
Author: Karboyan, S.
Tartarin, J.G.
Lambert, B.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

1 2 3 4 5

바구니보기

500-757 광주광역시 북구 용봉로 77 TEL 062)530-3571~2(대출반납실) FAX 062)530-3529

Copyright@2013 CHONNAM NATIONAL UNIVERSITY LIBRARY, All Rights Reserved.

108812
127119733