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전체선택

Dissecting Tensor Cores via Microbenchmarks: Latency, Throughput and Numeric Behaviors

학술저널

issue: IEEE Transactions on Parallel and Distributed Systems IEEE Trans. Parallel Distrib. Syst. Parallel and Distributed Systems, IEEE Transactions on. 34(1):246-261 Jan, 2023
Author: Sun, W.
Li, A.
Geng, T.
Stuijk, S.
Corporaal, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

CONVOLVE: Smart and seamless design of smart edge processors

보고서

Author: Gomony, M.
Putter, F.
Gebregiorgis, A.
Paulin, G.
Mei, L.
Jain, V.
Hamdioui, S.
Sanchez, V.
Grosser, T.
Geilen, M.
Verhelst, M.
Zenke, F.
Gurkaynak, F.
Bruin, B.
Stuijk, S.
Davidson, S.
De, S.
Ghogho, M.
Jimborean, A.
Eissa, S.
Benini, L.
Soudris, D.
Bishnoi, R.
Ainsworth, S.
Corradi, F.
Karrakchou, O.
Güneysu, T.
Corporaal, H.
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Reconfigurable Pipelined Control Systems

학술저널

issue: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 38(5):17-24 Oct, 2021
Author: Sanchez, R.M.
Nikkhah, S.T.
Goswami, D.
Heemels, M.
Stuijk, S.
Basten, T.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Camera-Based Vital Signs Monitoring During Sleep – A Proof of Concept Study

학술저널

issue: IEEE Journal of Biomedical and Health Informatics IEEE J. Biomed. Health Inform. Biomedical and Health Informatics, IEEE Journal of. 25(5):1409-1418 May, 2021
Author: van Gastel, M.
Stuijk, S.
Overeem, S.
van Dijk, J.P.
van Gilst, M.M.
de Haan, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A Fast Estimator of Performance with Respect to the Design Parameters of Self Re-Entrant Flowshops

회의자료

issue: 2016 Euromicro Conference on Digital System Design (DSD) Digital System Design (DSD), 2014 17th Euromicro Conference on Digital System Design (DSD), 2016 Euromicro Conference on. :215-221 Aug, 2016
Author: Waqas, U.
Geilen, M.
Stuijk, S.
Van Pinxten, J.
Basten, T.
Somers, L.
Corporaal, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A Scenario-Aware Dataflow Programming Model

회의자료

issue: 2015 Euromicro Conference on Digital System Design Digital System Design (DSD), 2015 Euromicro Conference on. :25-32 Aug, 2015
Author: Van Kampenhout, R.
Stuijk, S.
Goossens, K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Timing analysis of First-Come First-Served scheduled interval-timed Directed Acyclic Graphs

회의자료

issue: 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014. :1-6 Mar, 2014
Author: Frijns, R. M. W.
Adyanthaya, S.
Stuijk, S.
Voeten, J. P. M.
Geilen, M. C. W.
Schiffelers, R. R. H.
Corporaal, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Dataflow-Based Multi-ASIP Platform Approach for Digital Control Applications

회의자료

issue: 2013 Euromicro Conference on Digital System Design Digital System Design (DSD), 2013 Euromicro Conference on. :811-814 Sep, 2013
Author: Frijns, R.M.W.
Kamp, A.L.J.
Stuijk, S.
Voeten, J.P.M.
Bontekoe, M.
Gemei, K.J.A.
Corporaal, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Message from the chairs

회의자료

issue: 2016 14th ACM/IEEE Symposium on Embedded Systems For Real-time Multimedia (ESTIMedia) Embedded Systems For Real-time Multimedia (ESTIMedia), 2016 ACM/IEEE 14th Symposium on. :1-2 Oct, 2016
Author: Shafique, M.
Stuijk, S.
Oh, H.
Stefanov, T.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Schedule-Extended Synchronous Dataflow Graphs

학술저널

issue: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 32(10):1495-1508 Oct, 2013
Author: Damavandpeyma, M.
Stuijk, S.
Basten, T.
Geilen, M.
Corporaal, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

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