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1. Stans puer ad me[n]sa[m]

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2. Stans puer ad mensa[m] otherwise called the boke of norture / newly imprinted and very necessary vnto all youthe..

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3. De Christo gratis iustificante. Contra Osorianam iustitiam, caeterosque eiusdem inhaerentis iustiti[a]e patronos, Stan. Hosiu[m]. Andrad. Canisiu[m]. Vegam, Tiletanu[m], Lorichium, contra vniuersa[m] denique turbam Tridentinam & Iesuiticam. Amica & modesta defensio Ioan. Foxij.

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1

학술저널

issue
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 8(2):203-211 Dec, 2022
Author
Sakib, M.N.
Vakili, H.
Ganguly, S.
Ghosh, A.W.
Stan, M.
DB Label
Database : IEEE Xplore Digital Library
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3

회의자료

issue
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :382-387 Mar, 2020
Author
Altun, M.
Cevik, I.
Erten, A.
Eksik, O.
Stan, M.
Moritz, C.A.
DB Label
Database : IEEE Xplore Digital Library
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4

학술저널

issue
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits IEEE J. Explor. Solid-State Comput. Devices Circuits Exploratory Solid-State Computational Devices and Circuits, IEEE Journal on. 6(2):107-115 Dec, 2020
Author
Vakili, H.
Sakib, M.N.
Ganguly, S.
Stan, M.
Daniels, M.W.
Madhavan, A.
Stiles, M.D.
Ghosh, A.W.
DB Label
Database : IEEE Xplore Digital Library
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5

단행본

issue
Archeologies of Confession: Writing the German Reformation, 1517-2017. 16:45-66
Author
Landry, Stan M.
DB Label
Database : De Gruyter Online
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6

학술저널

issue
IEEE Computer Architecture Letters IEEE Comput. Arch. Lett. Computer Architecture Letters. 18(2):87-90 Dec, 2019
Author
Sadredini, E.
Rahimi, R.
Verma, V.
Stan, M.
Skadron, K.
DB Label
Database : IEEE Xplore Digital Library
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7

회의자료

issue
2016 IEEE International Symposium on Workload Characterization (IISWC) Workload Characterization (IISWC), 2016 IEEE International Symposium on. :1-12 Sep, 2016
Author
Wadden, J.
Dang, V.
Brunelle, N.
Ii, T.T.
Guo, D.
Sadredini, E.
Wang, K.
Bo, C.
Robins, G.
Stan, M.
Skadron, K.
DB Label
Database : IEEE Xplore Digital Library
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8

학술저널

issue
IEEE Consumer Electronics Magazine IEEE Consumer Electron. Mag. Consumer Electronics Magazine, IEEE. 9(3):88-89 May, 2020
Author
Voros, N.
Stan, M.
Huebner, M.
Keramidas, G.
DB Label
Database : IEEE Xplore Digital Library
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9

회의자료

issue
2013 8TH INTERNATIONAL SYMPOSIUM ON ADVANCED TOPICS IN ELECTRICAL ENGINEERING (ATEE) Advanced Topics in Electrical Engineering (ATEE), 2013 8th International Symposium on. :1-4 May, 2013
Author
Necula, Daniel
Vasile, Nicolae
Stan, M. F.
DB Label
Database : IEEE Xplore Digital Library
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10

회의자료

issue
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th. :1-4 Jun, 2012
Author
Patel, P.
Aiken, D.
Chumney, D.
Cornfeld, A.
Lin, Y.
Mackos, C.
McCarty, J.
Miller, N.
Sharps, P.
Stan, M.
DB Label
Database : IEEE Xplore Digital Library
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