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Ensuring Quality in Metal Additive Manufacturing Through a V-Model Framework

학술저널

issue: IEEE Access Access, IEEE. 11:123807-123819 2023
Author: Roh, B.
Simpson, T.W.
Yang, H.
Kumara, S.R.T.
Witherell, P.
Jones, A.T.
DB Label: Database : IEEE Xplore Digital Library

Ontology-Driven Learning of Bayesian Network for Causal Inference and Quality Assurance in Additive Manufacturing

학술저널

issue: IEEE Robotics and Automation Letters IEEE Robot. Autom. Lett. Robotics and Automation Letters, IEEE. 6(3):6032-6038 Jul, 2021
Author: Chen, R.
Lu, Y.
Witherell, P.
Simpson, T.W.
Kumara, S.
Yang, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A Work-Centered Visual Analytics Model to Support Engineering Design with Interactive Visualization and Data-Mining

회의자료

issue: 2012 45th Hawaii International Conference on System Sciences System Science (HICSS), 2012 45th Hawaii International Conference on. :1845-1854 Jan, 2012
Author: Yan, X.
Qiao, M.
Li, J.
Simpson, T.W.
Stump, G.M.
Zhang, X.
DB Label: Database : IEEE Xplore Digital Library

Product family design knowledge representation, integration, and reuse

회의자료

issue: IRI -2005 IEEE International Conference on Information Reuse and Integration, Conf, 2005. Information Reuse and Integration Information Reuse and Integration, Conf, 2005. IRI -2005 IEEE International Conference on.. :32-37 2005
Author: Nanda, J.
Thevenot, H.J.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

Knowledge representation for product design using Techspecs Concept Ontology

회의자료

issue: IRI -2005 IEEE International Conference on Information Reuse and Integration, Conf, 2005. Information Reuse and Integration Information Reuse and Integration, Conf, 2005. IRI -2005 IEEE International Conference on.. :241-246 2005
Author: Moon, S.K.
Kumara, S.R.T.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

Trade space exploration of satellite datasets using a design by shopping paradigm

회의자료

issue: 2004 IEEE Aerospace Conference Proceedings (IEEE Cat. No.04TH8720) Aerospace conference Aerospace Conference, 2004. Proceedings. 2004 IEEE. 6:3885-3895 Vol.6 2004
Author: Stump, G.M.
Yukish, M.
Simpson, T.W.
O'Hara, J.J.
DB Label: Database : IEEE Xplore Digital Library

New approaches to high speed civil transport multidisciplinary design and optimization

회의자료

issue: 2000 IEEE Aerospace Conference. Proceedings (Cat. No.00TH8484) Aerospace conference Aerospace Conference Proceedings, 2000 IEEE. 1:355-369 vol.1 2000
Author: Zink, P.S.
DeLaurentis, D.A.
Hale, M.A.
Volovoi, V.V.
Schrage, D.P.
Craig, J.I.
Fulton, R.E.
Mistree, F.
Mavris, D.N.
Wei Chen
Rohl, P.J.
Lewis, K.E.
Koch, P.N.
Cesnik, C.E.S.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

Increasing Design Search Relevancy using Statistical Methods in Conjunction with Ontologies

회의자료

issue: 2006 IEEE International Conference on Information Reuse & Integration Information Reuse and Integration, 2006 IEEE International Conference on. :268-273 Sep, 2006
Author: Alizon, F.
Nanda, J.
Shooter, S.B.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

Redesigning Product Families using Heuristics and Shared Ontological Component Information

회의자료

issue: 2006 IEEE International Conference on Information Reuse & Integration Information Reuse and Integration, 2006 IEEE International Conference on. :330-335 Sep, 2006
Author: Thevenot, H.J.
Nanda, J.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

Provide Relevant Knowledge to Specify Product Design Project Needs

회의자료

issue: 2006 IEEE International Conference on Information Reuse & Integration Information Reuse and Integration, 2006 IEEE International Conference on. :460-465 Sep, 2006
Author: Alizon, F.
Shooter, S.B.
Simpson, T.W.
DB Label: Database : IEEE Xplore Digital Library

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