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전체선택

Determination of interfacial layers in high-k nanomaterials by ADXPS measurements

회의자료

issue: 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" Students and Young Scientists Workshop, 2010 IEEE International. :89-92 Jun, 2010
Author: Wyrodek, J.
Tallarida, M.
Weisheit, M.
Schmeisser, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Ultrathin TaN/Ta barrier modifications to fullfill next technology node requirements

회의자료

issue: 2011 IEEE International Interconnect Technology Conference Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM), 2011 IEEE International. :1-3 May, 2011
Author: Gerlich, L.
Ohsiek, S.
Klein, C.
Geiss, M.
Friedemann, M.
Kucher, P.
Schmeisser, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Geometry and Microstructure Effect on EM-Induced Copper Interconnect Degradation

학술저널

issue: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 9(1):20-30 Mar, 2009
Author: Zschech, E.
Ho, P. S.
Schmeisser, D.
Meyer, M. A.
Vairagar, A. V.
Schneider, G.
Hauschildt, M.
Kraatz, M.
Sukharev, V.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Novel Carbon-Cage-Based Ultralow- $k$ Materials: Modeling and First Experiments

학술저널

issue: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 21(4):646-660 Nov, 2008
Author: Zagorodniy, K.
Chumakov, D.
Taschner, C.
Lukowiak, A.
Stegmann, H.
Schmeißer, D.
Geisler, H.
Engelmann, H.-J.
Hermann, H.
Zschech, E.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Tailoring optical and electrical properties of thin-film coatings based on mixed Hf and Ti oxides for optoelectronic application

학술저널

issue: In Materials & Design 5 August 2019 175
Author: Obstarczyk, A.
Kaczmarek, D.
Wojcieszak, D.
Mazur, M.
Domaradzki, J.
Kotwica, T.
Pastuszek, R.
Schmeisser, D.
Mazur, P.
Kot, M.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) Full Text (ScienceDirect O/A) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Characterization of chemical bonding in low-k dielectric materials for interconnect isolation: a xas and eels study

학술저널

Author: Hoffmann, P.
Schmeisser, D.
Engelmann, H.-J.
Zschech, E.
Stegmann, H.
Himpsel, F.
Denlinger, J.
DB Label: Database : eScholarship

원문보기: Open Access (eScholarship)

Spin state and satellite structures of ε-Fe2O3 as determined by resonant photoelectron spectroscopy

학술저널

issue: In Nuclear Inst. and Methods in Physics Research, B 1 December 2015 364:127-131
Author: Schmeißer, D.
Haeberle, J.
Richter, M.
Brazda, P.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Advanced MOSFET Gate Dielectrics for High-Performance Microprocessors: Materials Selection and Analytical Challenges

전자책

issue: Advances in Solid State Physics. 45:375-389
Author: Zschech, E.^Aff1
Engelmann, H.J.^Aff1
Ohsiek, S.^Aff1
Tracy, B.^Aff2
Adem, E.^Aff2
Robie, S.^Aff2
Bernard, J.^Aff2
Schmeisser, D.^Aff3
DB Label: Database : Springer Nature eBooks

원문보기

Electronic Properties of the Interface Formed by Pr2O3 Growth on Si(001), Si(111) and SiC(0001) Surfaces

전자책

issue: Materials for Information Technology : Devices, Interconnects and Packaging. :449-459
Author: Schmeißer, D.^Aff5
Hoffmann, P.^Aff5
Beuckert, G.^Aff5
DB Label: Database : Springer Nature eBooks