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출판물 검색결과(총 1건)

1. The faithfull subiect: or Mephiboseth And Salomons porch: or A caueat for them that enter Gods house: in two sermons preached at Paules Crosse: allowed by authority and now published vpon occasion: by W. Westerman Bachel: of Divinity, and chapl. to the Right Honourable, and Ri. Reuerend, the L. Archb. of Canturbury.

전문(Full Text) 제공 DB / 패키지 :

Early English Books Online (EEBO) ProQuest 1608)

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A physics-based numerical modeling of total ionizing dose effects in CMOS integrated circuits

회의자료

issue: 2023 Argentine Conference on Electronics (CAE) Electronics (CAE), 2023 Argentine Conference on. :41-45 Mar, 2023
Author: Cassani, M.V.
Salomone, L. Sambuco
Carbonetto, S.
Redin, E.
Faigon, A.
Garcia-Inza, M.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Modeling Switched Bias Irradiations on Floating Gate Devices: Application to Dosimetry

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(6):1229-1235 Jun, 2022
Author: Sambuco Salomone, L.
Garcia-Inza, M.
Carbonetto, S.
Lipovetzky, J.
Redin, E.
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Simplified model for radiation effects in MOS devices

회의자료

issue: 2016 Argentine Conference of Micro-Nanoelectronics, Technology and Applications (CAMTA) Micro-Nanoelectronics, Technology and Applications (CAMTA), Argentine Conference of. :27-32 Aug, 2016
Author: Salomone, L. Sambuco
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Quantized bands model for the determination of the dielectric constant of high-κ layers

회의자료

issue: 2015 Argentine School of Micro-Nanoelectronics, Technology and Applications (EAMTA) Micro-Nanoelectronics, Technology and Applications (EAMTA), 2015 Argentine School of. :43-46 Jul, 2015
Author: Salomone, L. Sambuco
Beldarrain, O.
Campabadal, F.
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Influence of Interface Traps on MOSFET thermal coefficients and its effects on the ZTC current

학술저널

issue: In Microelectronics Reliability October 2022 137
Author: García Cozzi, R.
Redín, E.
Garcia–Inza, M.
Sambuco Salomone, L.
Faigón, A.
Carbonetto, S.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Application of a CMOS differential and amplified dosimeter with Field Oxide n-channel MOSFETs to Diagnosis X-Ray beams

회의자료

issue: 2014 Argentine Conference on Micro-Nanoelectronics, Technology and Applications (EAMTA) Micro-Nanoelectronics, Technology and Applications (EAMTA), 2014 Argentine Conference on. :59-63 Jul, 2014
Author: Carbonetto, S.
Garcia-Inza, M.
Lipovetzky, J.
Carra, M.J.
Redin, E.
Sambuco Salomone, L.
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Pulsed capacitance-voltage measurements on Al2O3-based MOS capacitors

회의자료

issue: 2014 Argentine Conference on Micro-Nanoelectronics, Technology and Applications (EAMTA) Micro-Nanoelectronics, Technology and Applications (EAMTA), 2014 Argentine Conference on. :54-58 Jul, 2014
Author: Sambuco Salomone, L.
Lipovetzky, J.
Carbonetto, S.H.
Garcia-Inza, M.A.
Redin, E.G.
Campabadal, F.
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Numerical modeling of radiation-induced charge neutralization in MOS devices

학술저널

issue: In Radiation Measurements April 2022 153
Author: Sambuco Salomone, L.
Garcia-Inza, M.
Carbonetto, S.
Lipovetzky, J.
Redin, E.
Faigón, A.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE)

Numerical Modeling of MOS Dosimeters Under Switched Bias Irradiations

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 62(4):1665-1673 Aug, 2015
Author: Sambuco Salomone, L.
Faigon, A.
Redin, E. G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 원문복사신청 - FRIC

Radiation response of Al2O3-based MOS capacitors under different bias conditions

회의자료

issue: 2013 7th Argentine School of Micro-Nanoelectronics, Technology and Applications Micro-Nanoelectronics, Technology and Applications (EAMTA), 2013 7th Argentine School of. :22-26 Aug, 2013
Author: Salomone, L. Sambuco
Kasulin, A.
Lipovetzky, J.
Carbonetto, S. H.
Inza, M. A. Garcia
Redin, E. G.
Berbeglia, F.
Campabadal, F.
Faigon, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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