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4
Practical considerations for high throughput wafer level tests of silicon-photonics integrated devices 미리보기

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issue
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-6 Aug, 2020
Author
McLean, Kate
Ma, Calvin
Roy, Subharup Gupta
Guan, Fen
Ding, Hanyi
Green, Bart
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Database : IEEE Xplore Digital Library
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5
Fully automated in-line optical test system: Advanced materials & photonics 미리보기

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issue
2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2018 29th Annual. :399-402 Apr, 2018
Author
Hu, Shuren
Stricker, Andy
McLean, Kate
Ma, Calvin
Roy, Subharup Gupta
Percy, Dean
Cartier, John
Clark, David
Van Roijen, Raymond
Green, Bart
Dezfulian, Kevin
Medina, Louis
Ferrario, John
Riggs, David
Giewont, Ken
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Database : IEEE Xplore Digital Library
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7
Snapshot imaging Fraunhofer line discriminator 미리보기

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issue
2014 11th Annual High Capacity Optical Networks and Emerging/Enabling Technologies (Photonics for Energy) High-capacity Optical Networks and Emerging/Enabling Technologies (HONET), 2014 11th Annual. :62-66 Dec, 2014
Author
Roy, Subharup Gupta
Kudenov, Michael W.
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Database : IEEE Xplore Digital Library
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8
Ultraspectral imaging and the snapshot advantage 미리보기

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issue
Proceedings of SPIE; May 2015, Vol. 9467 Issue: 1 p94671X-94671X-9, 852049p
Author
George, Thomas
Dutta, Achyut K.
Islam, M. Saif
Kudenov, Michael W.
Gupta Roy, Subharup
Pantalone, Brett
Maione, Bryan
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Database : Supplemental Index
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