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전체선택

Performance Improvements of SiGe HBTs in 90nm BiCMOS Process with fT/fmax of 340/410 GHz

회의자료

issue: 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS) BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), 2022 IEEE. :232-235 Oct, 2022
Author: Raghunathan, U. S.
Sirohi, S.
Ruparelia, V.
Sharma, P. K.
Ioannou, D. P.
Jain, V.
Kakara, H. K.
Gedela, S.
Vanukuru, V.
Dongmo, P.
Luce, C.
Hazbun, R.
Krishnasamy, R.
Hwang, J.
Levy, M.
Welch, K.
Liu, S.
Cucci, B.
Cole, S.
Kantarovsky, J.
Vallett, A.
McCallum-Cook, I.
Yu, M.
Phelps, R.
Divergilio, A.
Sturm, A.
Peters, M.
Johnson, S.
Rassel, R.
Lagerquist, M.
Kerbaugh, M.
Newton, K.
Pekarik, J.
Liu, Q.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Investigation of HBT layout impact on fT doubler performance for 90nm SiGe HBTs

회의자료

issue: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE. :5-8 Sep, 2014
Author: Jain, Vibhor
Gross, B. J.
Pekarik, J. J.
Adkisson, J. W.
Camillo-Castillo, R. A.
Liu, Qizhi
Gray, P. B.
Vallett, A.
Divergilio, A. W.
Zetterlund, B. K.
Harame, D. L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Device and circuit performance of SiGe HBTs in 130nm BiCMOS process with fT/fMAX of 250/330GHz

회의자료

issue: 2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2014 IEEE. :96-99 Sep, 2014
Author: Jain, Vibhor
Kessler, T.
Gross, B. J.
Pekarik, J. J.
Candra, P.
Gray, P. B.
Sadhu, B.
Valdes-Garcia, A.
Cheng, P.
Camillo-Castillo, R. A.
Newton, K.
Natarajan, A.
Reynolds, S. K.
Harame, D. L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Schottky Barrier Diodes in 90nm SiGe BiCMOS process operating near 2.0 THz cut-off frequency

회의자료

issue: 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE. :73-76 Sep, 2013
Author: Jain, Vibhor
Cheng, Peng
Gross, B. J.
Camillo-Castillo, R.
Pekarik, J. J.
Adkisson, J. W.
Liu, Qizhi
Gray, P. B.
Kaushal, V.
Harame, D.
Divergilio, Adam W.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

SiGe HBTs in 90nm BiCMOS technology demonstrating 300GHz/420GHz fT/fMAX through reduced Rb and Ccb parasitics

회의자료

issue: 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 2013 IEEE. :227-230 Sep, 2013
Author: Camillo-Castillo, R.A.
Liu, Q.Z.
Adkisson, J. W.
Khater, M.H.
Gray, P. B.
Jain, V.
Leidy, R.K.
Pekarik, J. J.
Gambino, J.P.
Zetterlund, B.
Willets, C.
Parrish, C.
Engelmann, S.U.
Pyzyna, A.M.
Cheng, P.
Harame, D. L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

On-chip frequency-dependent inductor for multi-band circuit designs

회의자료

issue: The 40th European Microwave Conference Microwave Conference (EuMC), 2010 European. :421-424 Sep, 2010
Author: Woods, W.
Ding, H.
Wang, G.
Sun, P.
Rascoe, J.
Tannhof, P.
Pekarik, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Evaluation of sub-32nm CMOS technology for Millimeter wave applications

회의자료

issue: The 40th European Microwave Conference Microwave Conference (EuMC), 2010 European. :417-420 Sep, 2010
Author: Morandini, Y.
Gianesello, F.
Boret, S.
Lasserre, S.
Gloria, D.
Pekarik, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

An Investigation of Single-Event Effects and Potential SEU Mitigation Strategies in Fourth-Generation, 90 nm SiGe BiCMOS

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 60(6):4175-4183 Dec, 2013
Author: Lourenco, N. E.
Phillips, S. D.
England, T. D.
Cardoso, A. S.
Fleetwood, Z. E.
Moen, K. A.
McMorrow, D.
Warner, J. H.
Buchner, S. P.
Paki-Amouzou, P.
Pekarik, J.
Harame, D.
Raman, A.
Turowski, M.
Cressler, J. D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

RF FET layout and modeling for design success in RFCMOS technologies

회의자료

issue: 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers Radio frequency integrated circuits Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE. :57-60 2005
Author: Jagannathan, B.
Greenberg, D.
Anna, R.
Wang, X.
Pekarik, J.
Breitwisch, M.
Erturk, M.
Wagner, L.
Schnabel, C.
Sanderson, D.
Csutak, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Record RF performance of sub-46 nm L/sub gate/ NFETs in microprocessor SOI CMOS technologies

회의자료

issue: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest. International Electron Devices Meeting 2005 Electron Devices Meeting, 2005. IEDM Technical Digest. IEEE International. :241-244 2005
Author: Sungjae Lee
Wagner, L.
Jagannathan, B.
Csutak, S.
Pekarik, J.
Zamdmer, N.
Breitwisch, M.
Ramachandran, R.
Freeman, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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