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1. Poor Robin's prophecy, for the year 1701 Found several years after his death, hid under an old close-stool-pan. And now publish'd by his executors, to make some people merry, and the rest mad. Containing, comical predictions for every month in the year, carefully calculated, to make both sexes shake their sides till they break their twatling-string

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2. Room for a joviall tinker old brass to mend, or, Here is a tinker full of mettle the which can mend pot pan or kettle, for stopping of holes is his delight his work goes forward day and night if there be any women brave, whose coldrons need of mending have send for this tinker nere deny him he'd do your work well if you try him. A proof of him Ile

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1

학술저널

issue
IEEE Transactions on Consumer Electronics IEEE Trans. Consumer Electron. Consumer Electronics, IEEE Transactions on. 70(1):2224-2234 Feb, 2024
Author
Tang, Y.
Pan, D.
Ye, Q.
Li, Y.
Yu, J.
DB Label
Database : IEEE Xplore Digital Library
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2

학술저널

issue
IEEE Transactions on Computational Social Systems IEEE Trans. Comput. Soc. Syst. Computational Social Systems, IEEE Transactions on. 11(1):247-266 Feb, 2024
Author
Pan, D.
Luo, G.
Zeng, A.
Zou, C.
Liang, H.
Wang, J.
Zhang, T.
Yang, B.
DB Label
Database : IEEE Xplore Digital Library
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4

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-9 2024
Author
Jin, Y.
Yao, C.
Li, L.
Pan, D.
Li, J.
DB Label
Database : IEEE Xplore Digital Library
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5

학술저널

issue
IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-18 2024
Author
Zhang, S.
Chen, Y.
Wang, B.
Pan, D.
Zhang, W.
Li, A.
DB Label
Database : IEEE Xplore Digital Library
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6

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-11 2024
Author
Liu, Y.
Pan, D.
DB Label
Database : IEEE Xplore Digital Library
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7

학술저널

issue
IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-17 2024
Author
Wu, D.
Chen, P.
Kong, W.
Pan, D.
DB Label
Database : IEEE Xplore Digital Library
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8

학술저널

issue
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-11 2024
Author
Jiang, Z.
Chang, Z.
Xu, C.
Pan, D.
Yu, H.
Gui, W.
DB Label
Database : IEEE Xplore Digital Library
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9

학술저널

issue
IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-17 2024
Author
Ye, F.
Hao, Z.
Pan, D.
DB Label
Database : IEEE Xplore Digital Library
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10

학술저널

issue
IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 62:1-18 2024
Author
Pan, D.
Gao, X.
Dai, W.
Fu, J.
Wang, Z.
Sun, X.
Wu, Y.
DB Label
Database : IEEE Xplore Digital Library
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