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1
22nm FD-SOI Technology with Back-biasing Capability Offers Excellent Performance for Enabling Efficient, Ultra-low Power Analog and RF/Millimeter-Wave Designs 미리보기

회의자료

issue
2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2019 IEEE. :323-326 Jun, 2019
Author
Ong, S.N.
Chan, L.H.K.
Chew, K.W.J.
Lim, C.K.
Oo, W. L.
Bellaouar, A.
Zhang, C.
Chow, W.H.
Chen, T.
Rassel, R.
Wong, J.S.
Wan, C.W.F.
Kim, J.
Seet, W.H.
Harame, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
2
22nm Fully-Depleted SOI High Frequency Noise Modeling up to 90GHz Enabling Ultra Low Noise Millimetre-Wave LNA Design 미리보기

회의자료

issue
2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2019 IEEE. :31-34 Jun, 2019
Author
Chan, L.H.K.
Ong, S.N.
Oo, W. L.
Chew, K.W.J.
Zhang, C.
Bellaouar, A.
Chow, W.H.
Chen, T.
Rassel, R.
Wong, J.S.
Lim, C.K.
Wan, C.W.F.
Kim, J.
Seet, W.H.
Harame, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
4
RF-pFET in fully depleted SOI demonstrates 420 GHz FT 미리보기

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issue
2017 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2017 IEEE. :84-87 Jun, 2017
Author
Watts, J.
Sundaram, K.
Johnny Chew, K.W.
Lehmann, S.
Ong, S.N.
Chow, W.H.
Chan, L.H.
Mazurier, J.
Schwan, C.
Andee, Y.
Feudel, T.
Pirro, L.
Erben, E.
Nowak, E.
Smith, E.
Bazizi, E.M.
Kammler, T.
Taylor, R.
Rice, B.
Harame, D.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
5
A 22nm FDSOI Technology with integrated 3.3V/5V/6.5V RFLDMOS Devices for IOT SOC applications 미리보기

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issue
2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2018 IEEE. :1-3 Oct, 2018
Author
Schippel, C.
Lehmann, S.
Ong, S.N.
Muehlhoff, A.
Cortes, I.
Chow, W.H.
Utess, D.
Zaka, A.
Divay, A.
Pakfar, A.
Faul, J.
Mazurier, J.
Chew, K.W.
Chan, L.H.K.
Taylor, R.
Rice, B.
Harame, D.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
6
Analytical high frequency channel thermal noise modeling in deep sub-micron MOSFETs 미리보기

회의자료

issue
Proceedings of the 2009 12th International Symposium on Integrated Circuits Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on. :306-309 Dec, 2009
Author
Ong, S.N.
Yeo, K.S.
Chew, K.W.J.
Chan, L.H.K.
Loo, X.S.
Do, M.A.
Boon, C.C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
7
High frequency drain current noise modeling in MOSFETs under sub-threshold condition 미리보기

회의자료

issue
Proceedings of the 2009 12th International Symposium on Integrated Circuits Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on. :310-313 Dec, 2009
Author
Chan, L.H.K.
Yeo, K.S.
Chew, K.W.J.
Ong, S.N.
Loo, X.S.
Boon, C.C.
Do, M.A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
8
A novel de-embedding technique for On-Wafer characterization of RF CMOS 미리보기

회의자료

issue
2009 International SoC Design Conference (ISOCC) SoC Design Conference (ISOCC), 2009 International. :29-32 Nov, 2009
Author
Loo, X.S.
Yeo, K.S.
Chew, K.W.J.
Chan, L.H.K.
Ong, S.N.
Do, M.A.
Boon, C.C.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
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