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  • 자료유형
    • Conference Materials (7)
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    • 2009 ieee 8th international conference on asic (1)
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1
Impedance Spectroscopy and Electrophysiological Imaging of Cells With a High-Density CMOS Microelectrode Array System 미리보기

학술저널

issue
IEEE Transactions on Biomedical Circuits and Systems IEEE Trans. Biomed. Circuits Syst. Biomedical Circuits and Systems, IEEE Transactions on. 12(6):1356-1368 Dec, 2018
Author
Viswam, V.
Bounik, R.
Shadmani, A.
Dragas, J.
Urwyler, C.
Boos, J.A.
Obien, M.E.J.
Muller, J.
Chen, Y.
Hierlemann, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
3
Wire-bonding-based vertical microprobe electrode arrays integrated onto high-density microelectrode arrays with active circuitry for extracellular recording 미리보기

회의자료

issue
2015 Transducers - 2015 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS) Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS), 2015 Transducers - 2015 18th International Conference on. :2232-2235 Jun, 2015
Author
Hidaka, S.
Obien, M.E.J.
Frey, U.
Konishi, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
4
Constrained ATPG for functional RTL circuits using F-Scan. 미리보기

회의자료

issue
2010 IEEE International Test Conference (ITC); 2010, p1-10, 10p
Author
Obien, M.E.J.
Ohtake, S.
Fujiwara, H.
DB Label
Database : Complementary Index
원문보기
Full Text (IEEE) 
5
Secure and testable scan design using extended de Bruijn graphs. 미리보기

회의자료

issue
2010 15th Asia & South Pacific Design Automation Conference (ASP-DAC); 2010, p413-418, 6p
Author
Fujiwara, H.
Obien, M.E.J.
DB Label
Database : Complementary Index
원문보기
Full Text (IEEE) 
6
Delay fault ATPG for F-scannable RTL circuits. 미리보기

회의자료

issue
2010 International Symposium on Communications & Information Technologies (ISCIT); 2010, p717-722, 6p
Author
Obien, M.E.J.
Ohtake, S.
Fujiwara, H.
DB Label
Database : Complementary Index
원문보기
Full Text (IEEE) 
7
F-scan: An approach to functional RTL scan for assignment decision diagrams. 미리보기

회의자료

issue
2009 IEEE 8th International Conference on ASIC; 2009, p589-592, 4p
Author
Obien, M.E.J.
Fujiwara, H.
DB Label
Database : Complementary Index
원문보기
Full Text (IEEE) 
8
F-Scan Test Generation Model for Delay Fault Testing at RTL Using Standard Full Scan ATPG. 미리보기

회의자료

issue
European Test Symposium (ETS), 2011 16th IEEE; 2011, p203-203, 1p
Author
Obien, M.E.J.
Ohtake, S.
Fujiwara, H.
DB Label
Database : Complementary Index
원문보기
Full Text (IEEE) 
1 
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