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1
Investigations Into Unintended ESD Generator Artifacts: Prepulse and Postpulse 미리보기

학술저널

issue
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 63(6):1791-1798 Dec, 2021
Author
Zhou, J.
Wei, P.
Shen, L.
Yan, X.
Maghlakelidze, G.
Notermans, G.
Bub, S.
Holland, S.
Pommerenke, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
2
3-D TCAD Methodology for Simulating Double-Hysteresis Filamentary I–V Behavior and Holding Current in ESD Protection SCRs 미리보기

학술저널

issue
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(9):4214-4222 Sep, 2021
Author
Karaca, H.
Holland, S.
Ritter, H.
Kumar, V.
Notermans, G.
Pogany, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
3
Simultaneous and Sequential Triggering in Multi-Finger Floating-Base SCRs Depending on TLP Pulse Rise Time 미리보기

학술저널

issue
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(4):632-640 Dec, 2020
Author
Karaca, H.
Fleury, C.
Holland, S.
Kumar, V.
Ritter, H.
Notermans, G.
Pogany, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
4
Transient Overshoot Voltages During VF-TLP Pulses for Bipolar Devices in the Presence of Lowly Doped Regions 미리보기

학술저널

issue
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(4):650-657 Dec, 2020
Author
Holland, S.
Notermans, G.
Ritter, H.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
5
Dynamic Voltage Overshoot During Triggering of an SCR-Type ESD Protection 미리보기

학술저널

issue
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 19(4):583-590 Dec, 2019
Author
Notermans, G.
Ritter, H.
Holland, S.
Pogany, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
6
Robustness of PIN Limiter Diodes to an ESD Event Based on VF-TLP Characterization 미리보기

학술저널

issue
IEEE Letters on Electromagnetic Compatibility Practice and Applications IEEE Lett. on Electromagn. Compat. Pract. and Appl. Electromagnetic Compatibility Practice and Applications, IEEE Letters on. 1(1):9-13 Mar, 2019
Author
Marathe, S.
Saxena, D.
Pommerenke, D.
Huang, W.
Notermans, G.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
7
A Class-AB/D Audio Power Amplifier for Mobile Applications Integrated Into a 2.5G/3G Baseband Processor 미리보기

학술저널

issue
IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 57(5):1003-1016 May, 2010
Author
Groeneweg, W. H.
Pilloud, B.
Neri, F.
Notermans, G.
Balucani, M.
Helfenstein, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
8
The effect of silicide on ESD performance 미리보기

회의자료

issue
1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :154-158 1999
Author
Notermans, G.
Heringa, A.
Van Dort, M.
Jansen, S.
Kuper, F.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
9
Pitfalls when correlating TLP, HBM and MM testing 미리보기

회의자료

issue
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998. :170-176 1998
Author
Notermans, G.
De Jong, P.
Kuper, F.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
10
High voltage resistant ESD protection circuitry for 0.5 /spl mu/m CMOS OTP/EPROM programming pin 미리보기

회의자료

issue
Electrical Overstress/ Electrostatic Discharge Symposium Proceedings. 1998 (Cat. No.98TH8347) Electrical overstress/electrostatic discharge Electrical Overstress/Electrostatic Discharge Symposium Proceedings, 1998. :96-103 1998
Author
Schroder, H.-U.
Van Steenwijk, G.
Notermans, G.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
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