전남대학교 중앙도서관

Modeling Framework to Compare High Voltage Vertical GaN PN and Merged PN-Schottky Diodes

회의자료

issue: 2024 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2024 IEEE. :2663-2669 Feb, 2024
Author: Atwimah, Samuel K.
Nelson, Tolen
Pandey, Prakash
Fox, Aidan P.
Georgiev, Daniel G.
Jacobs, Alan G.
Koehler, Andrew D.
Hobart, Karl D.
Anderson, Travis J.
Khanna, Raghav
DB Label: Database : IEEE Xplore Digital Library

Design, Packaging, and Empirical Characterization of 1 kV Vertical GaN P-N Diode

회의자료

issue: 2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2023 IEEE. :2496-2502 Mar, 2023
Author: Mahmud, Sadab
Pandey, Prakash
Atwimah, Samuel K.
Nelson, Tolen
Georgiev, Daniel G.
Koehler, Andrew D.
Anderson, Travis J.
Gallagher, James C.
Hobart, Karl D.
Khanna, Raghav
DB Label: Database : IEEE Xplore Digital Library

Characterization and Modeling of a 1.3 kV Vertical GaN Diode

회의자료

issue: 2022 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2022 IEEE. :928-935 Mar, 2022
Author: Pandey, Prakash
Collings, William
Mahmud, Sadab
Nelson, Tolen
Hontz, Michael R.
Georgiev, Daniel G.
Koehler, Andrew D.
Anderson, Travis J.
Gallagher, James C.
Foster, Geoffrey M.
Jacobs, Alan
Ebrish, Mona A.
Hobart, Karl D.
Khanna, Raghav
DB Label: Database : IEEE Xplore Digital Library

Optimization Algorithms for Dynamic Tuning of Wide Bandgap Semiconductor Device Models

회의자료

issue: 2021 IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2021 IEEE. :2427-2433 Jun, 2021
Author: Collings, William
Nelson, Tolen
Sellers, Andrew
Khanna, Raghav
Courtay, Alan
Jimenez, Sergio
Lemmon, Andrew
DB Label: Database : IEEE Xplore Digital Library

Hybrid Edge Termination for High-Voltage Vertical GaN Devices: Empirical Validation and Robust Processing Tolerance

학술저널

issue: IEEE TRANSACTIONS ON ELECTRON DEVICES; APR 8 2024, 8p.
Author: Pandey, Prakash
Nelson, Tolen M.
Hontz, Michael R.
Georgiev, Daniel G.
Khanna, Raghav
Jacobs, Alan G.
Lundh, James S.
Gallagher, James C.
Koehler, Andrew D.
Hobart, Karl D.
Anderson, Travis J.
DB Label: Database : Science Citation Index Expanded

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science 등재 - SCOPUS

Experimental Validation of Robust Hybrid Edge Termination Structures in Vertical GaN p-i-n Diodes With Avalanche Capability

정기출판물

issue: IEEE Electron Device Letters; 2024, Vol. 45 Issue: 5 p873-876, 4p
Author: Lundh, James Spencer
Jacobs, Alan G.
Pandey, Prakash
Nelson, Tolen
Georgiev, Daniel G.
Koehler, Andrew D.
Khanna, Raghav
Tadjer, Marko J.
Hobart, Karl D.
Anderson, Travis J.
DB Label: Database : Supplemental Index

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS

Examination of Trapping Effects on Single-Event Transients in GaN HEMTs

학술저널

issue: IEEE TRANSACTIONS ON NUCLEAR SCIENCE; APR 2023, 70 4, p328-p335, 8p.
Author: Nelson, Tolen
Georgiev, Daniel G.
Hontz, Michael R.
Khanna, Raghav
Ildefonso, Adrian
Koehler, Andrew D.
Hobart, Karl
Khachatrian, Ani
McMorrow, Dale
DB Label: Database : Science Citation Index Expanded

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science 등재 - SCOPUS

Hybrid Edge Termination in Vertical GaN: Approximating Beveled Edge Termination via Discrete Implantations

학술저널

issue: IEEE TRANSACTIONS ON ELECTRON DEVICES; DEC 2022, 69 12, p6940-p6947, 8p.
Author: Nelson, Tolen
Pandey, Prakash
Georgiev, Daniel G.
Hontz, Michael R.
Koehler, Andrew D.
Hobart, Karl D.
Anderson, Travis J.
Ildefonso, Adrian
Khanna, Raghav
DB Label: Database : Science Citation Index Expanded

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science 등재 - SCOPUS

A Simple Edge Termination Design for Vertical GaN P-N Diodes

학술저널

issue: IEEE TRANSACTIONS ON ELECTRON DEVICES; JUL 27 2022, 8p.
Author: Pandey, Prakash
Nelson, Tolen M.
Collings, William M.
Hontz, Michael R.
Georgiev, Daniel G.
Koehler, Andrew D.
Anderson, Travis J.
Gallagher, James C.
Foster, Geoffrey M.
Jacobs, Alan
Ebrish, Mona A.
Gunning, Brendan P.
Kaplar, Robert J.
Hobart, Karl D.
Khanna, Raghav
DB Label: Database : Science Citation Index Expanded

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science 등재 - SCOPUS

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