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전체선택

Development of Low Frequency (20–100 kHz) Clinically Viable Ultrasound Applicator for Chronic Wound Treatment

학술저널

issue: IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control IEEE Trans. Ultrason., Ferroelect., Freq. Contr. Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on. 66(3):572-580 Mar, 2019
Author: Ngo, O.
Niemann, E.
Gunasekaran, V.
Sankar, P.
Putterman, M.
Lafontant, A.
Nadkarni, S.
DiMaria-Ghalili, R.A.
Neidrauer, M.
Zubkov, L.
Weingarten, M.
Margolis, D.J.
Lewin, P.A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Mechanism of Electron Trapping and Characteristics of Traps in $\hbox{HfO}_{2}$ Gate Stacks

학술저널

issue: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 7(1):138-145 Mar, 2007
Author: Bersuker, G.
Sim, J. H.
Park, C. S.
Young, C. D.
Nadkarni, S. V.
Choi, R.
Lee, B. H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Electron Trapping Processes in High-K Gate Dielectrics and Nature of Traps

회의자료

issue: 2006 International Symposium on VLSI Technology, Systems, and Applications VLSI Technology, Systems, and Applications, 2006 International Symposium on. :1-2 Apr, 2006
Author: Bersuker, G.
Gavartin, J.
Sim, J.
Park, C.S.
Young, C.
Nadkarni, S.
Choi, R.
Shluger, A.
Lee, B.H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Intrinsic Threshold Voltage Instability of the HFO2 NMOS Transistors

회의자료

issue: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :179-183 Mar, 2006
Author: Bersuker, G.
Sim, J.H.
Park, C.S.
Young, C.D.
Nadkarni, S.
Choi, R.
Lee, B.H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Detection of Electron Trap Generation due to Constant Voltage Stress on High-κ Gate Stacks

회의자료

issue: 2006 IEEE International Reliability Physics Symposium Proceedings Reliability Physics Symposium Proceedings, 2006. 44th Annual., IEEE International. :169-173 Mar, 2006
Author: Young, C.D.
Nadkarni, S.
Heh, D.
Harris, H.R.
Choi, R.
Peterson, J.J.
Sim, J.H.
Krishnan, S.A.
Barnett, J.
Vogel, E.
Lee, B.H.
Zeitzoff, P.
Brown, G.A.
Bersuker, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Organic Complementary D Flip-Flops Enabled by Perylene Diimides and Pentacene

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 27(9):737-739 Sep, 2006
Author: Yoo, B.
Madgavkar, A.
Jones, B.A.
Nadkarni, S.
Facchetti, A.
Dimmler, K.
Wasielewski, M.R.
Marks, T.J.
Dodabalapur, A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Carbon Raw Material Effects on Aluminum Reduction Cell Anodes

전자책

issue: Essential Readings in Light Metals : Volume 4 Electrode Technology for Aluminum Production. :53-58
Author: Rhedey, P. J.^Aff3
Nadkarni, S. K.^Aff4
DB Label: Database : Springer Nature eBooks

원문보기

Evaluation of the Uniformity of Baking in Horizontal and Vertical Flue Ring Furnaces

전자책

issue: Essential Readings in Light Metals : Volume 4 Electrode Technology for Aluminum Production. :414-417
Author: Holdner, D. N.^Aff3
Nadkarni, S. K.^Aff3
DuTremblay, Denis^Aff3
DB Label: Database : Springer Nature eBooks

원문보기

Coker Feedstock Characteristics and Calcined Coke Properties

전자책

issue: Essential Readings in Light Metals : Volume 4 Electrode Technology for Aluminum Production. :19-23
Author: Rhedey, P. J.^Aff3
Nadkarni, S. K.^Aff4
DB Label: Database : Springer Nature eBooks

원문보기

Detection of trap generation in high-k gate stacks

회의자료

issue: 2005 IEEE International Integrated Reliability Workshop Integrated Reliability Workshop Integrated Reliability Workshop Final Report, 2005 IEEE International. :5 pp. 2005
Author: Young, C.D.
Heh, D.
Nadkarni, S.
Choi, R.
Peterson, J.J.
Harris, H.R.
Sim, J.H.
Krishnan, S.A.
Barnett, J.
Vogel, E.
Lee, B.H.
Zeitzoff, P.
Brown, G.A.
Bersuker, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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