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Simulation in action: the application of modelling to SPAD architecture design

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Pellegrini, S.
Nicholson, I.
Helleboid, R.
Mamdy, B.
Forcolin, G.
Al-Rawhani, M.
Buj, C.
Marchand, G.
Rae, B.
Golanski, D.
Mugny, G.
Bianchi, R. A.
Rideau, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs

회의자료

issue: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :144-147 Sep, 2023
Author: Rideau, D.
Uhring, W.
Bianchi, R. A.
Helleboid, R.
Mugny, G.
Grebot, J.
Manouvrier, J.R.
Neri, R.
Brun, F.
Lakeh, M. Dolatpoor
Rink, S.
Kammerer, J-B.
Lallement, C.
Lacombe, E.
Golanski, D.
Rae, B.
Bah, T. M.
Twaddle, F.
Quenette, V.
Marchand, G.
Buj, C.
Fillon, R.
Henrion, Y.
Nicholson, I.
Agnew, M.
Basset, M.
Perrier, R.
Al-Rawhani, M.
Mamdy, B.
Pellegrin, S.
Gouget, G.
Maciazek, P.
Juge, A.
Dartigues, A.
Alause, H. Wehbe
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Single Photon Avalanche Diode with Monte Carlo Simulations: PDE, Jitter and Quench Probability

회의자료

issue: 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2021 International Conference on. :293-296 Sep, 2021
Author: Rideau, D.
Oussaiti, Y.
Grebot, J.
Helleboid, R.
Lopez, A.
Mugny, G.
Bourreau, E.
Golanski, D.
Mamdy, B.
Alause, H. Wehbe
Nicholson, I.
Pellegrini, S.
Vlimant, C.E.
Agnew, M.
Cazimajou, T.
Pala, M.
Saint-Martin, J.
Dollfus, P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Verilog-A model for avalanche dynamics and quenching in Single-Photon Avalanche Diodes

회의자료

issue: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :145-148 Sep, 2020
Author: oussaiti, Y.
Rideau, D.
Manouvrier, J.R.
Quenette, V.
Mamdy, B.
Buj, C.
Grebot, J.
Wehbe-Alause, H.
Lopez, A.
Mugny, G.
Agnew, M.
Lacombe, E.
Pala, M.
Dollfus, P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A study of diffusive transport in 14nm FDSOI MOSFET: NEGF versus QDD

회의자료

issue: 2016 46th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2016 46th European. :424-427 Sep, 2016
Author: Mugny, G.
Pereira, F.G.
Rideau, D.
Triozon, F.
Niquet, Y.M.
Pala, M.
Garetto, D.
Delerue, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Full-zone k · p parametrization for III-As materials

회의자료

issue: 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2015 International Conference on. :28-31 Sep, 2015
Author: Mugny, G.
Rideau, D.
Triozon, F.
Niquet, Y.-M.
Kriso, C.
Pereira, F.G.
Garetto, D.
Tavernier, C.
Delerue, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Modeling study of the mobility in FDSOI devices with a focus on near-spacer-region

회의자료

issue: EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on. :49-52 Jan, 2015
Author: Pereira, F. G.
Rideau, D.
Nier, O.
Tavernier, C.
Triozon, F.
Garetto, D.
Mugny, G.
Sklenard, B.
Hiblot, G.
Pala, M.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Band structure of III-V thin films: An atomistic study of non-parabolic effects in confinement direction

회의자료

issue: EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon Ultimate Integration on Silicon (EUROSOI-ULIS), 2015 Joint International EUROSOI Workshop and International Conference on. :301-304 Jan, 2015
Author: Mugny, G.
Triozon, F.
Li, J.
Niquet, Y.-M.
Hiblot, G.
Rideau, D.
Delerue, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Experimental and theoretical investigation of the ‘apparent’ mobility degradation in Bulk and UTBB-FDSOI devices: A focus on the near-spacer-region resistance

회의자료

issue: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on. :101-104 Sep, 2014
Author: Rideau, D.
Monsieur, F.
Nier, O.
Niquet, Y. M.
Lacord, J.
Quenette, V.
Mugny, G.
Hiblot, G.
Gouget, G.
Quoirin, M.
Silvestri, L.
Nallet, F.
Tavernier, C.
Jaouen, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Compact Model for Inversion Charge in III–V Bulk MOSFET Including Non-Parabolicity

학술저널

issue: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 14(4):768-775 Jul, 2015
Author: Hiblot, G.
Mugny, G.
Rafhay, Q.
Boeuf, F.
Ghibaudo, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

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