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NVDRAM: A 32Gb Dual Layer 3D Stacked Non-volatile Ferroelectric Memory with Near-DRAM Performance for Demanding AI Workloads

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Ramaswamy, N.
Calderoni, A.
Zahurak, J.
Servalli, G.
Chavan, A.
Chhajed, S.
Balakrishnan, M.
Fischer, M.
Hollander, M.
Ettisserry, D. P.
Liao, A.
Karda, K.
Jerry, M.
Mariani, M.
Visconti, A.
Cook, B. R.
Cook, B. D.
Mills, D.
Torsi, A.
Mouli, C.
Byers, E.
Helm, M.
Pawlowski, S.
Shiratake, S.
Chandrasekaran, N.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Supercapacitors as Future Energy Storage Devices for Electric Vehicles

회의자료

issue: 2022 IEEE Delhi Section Conference (DELCON) Delhi Section Conference (DELCON), 2022 IEEE. :1-9 Feb, 2022
Author: L, Revanth Mouli C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Design Principles of Self-Compensated NBTI-Free Negative Capacitor FinFET

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(6):2238-2242 Jun, 2020
Author: Karda, K.
Mouli, C.
Alam, M.A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Editorial Special Issue on “Memory Devices and Technologies for the Next Decade”

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(4):1369-1372 Apr, 2020
Author: Compagnoni, C.M.
Kang, J.
Shih, Y.
Du, P.P.
Kim, T.
Mouli, C.
Yang, J.
Roy, K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Special Issue on Reliability

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(11):4497-4503 Nov, 2019
Author: Mahapatra, S.
Kerber, A.
Monzio Compagnoni, C.
Koval, R.
Meneghesso, G.
Sheridan, D.
Ramey, S.
Wang, R.
Stathis, J.
Chen, K.J.
Kaczer, B.
Pancheri, L.
Rosenbaum, E.
Mouli, C.
Wong, H.
DB Label: Database : IEEE Xplore Digital Library

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A Self-Consistent, Semiclassical Electrothermal Modeling Framework for Mott Devices

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(5):1672-1678 May, 2018
Author: Karda, K.
Mouli, C.
Ramanathan, S.
Alam, M.A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Current status and future prospects of non-volatile memory modeling

회의자료

issue: 2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on. :5-8 Sep, 2014
Author: Benvenuti, A.
Ghetti, A.
Mauri, A.
Liu, H.
Mouli, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Productivity improvement of a small scale industry by the application of an effective plant layout and weld-fixture design

학술저널

issue: In Materials Today: Proceedings
Author: Mouli, C. Shiva Bala Chandra
Kulkarni, Sudheer D.
Deepak, S.
DB Label: Database : ScienceDirect

원문보기: Full Text (ScienceDirect)

A breakthrough in optimizing throughput and manufacturing efficiency via factory-wide dynamic WIP dispatching in 300mm semiconductor manufacturing

회의자료

issue: ISSM 2005, IEEE International Symposium on Semiconductor Manufacturing, 2005. Semiconductor Manufacturing Semiconductor Manufacturing, 2005. ISSM 2005, IEEE International Symposium on. :39-42 2005
Author: Bo Li
Wu, J.
Herring, M.P.
Mouli, C.
DB Label: Database : IEEE Xplore Digital Library

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Next generation manufacturing execution system (mes) enabling fully integrated fab automation in 300mm technology development and manufacturing

회의자료

issue: IEEE/SEMI Conference and Workshop on Advanced Semiconductor Manufacturing 2005. Advanced Semiconductor Manufacturing Conference and Workshop, 2005 IEEE/SEMI. :77-85 2005
Author: Mouli, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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