전남대학교 중앙도서관

링크메뉴

주메뉴

- 게시판
- 전시마당

- 게시판
- 전시마당

- 대출반납서비스
- 도서신청서비스
- 시설이용서비스
- 장애학생 지원서비스
- 타기관이용서비스
- 무인예약대출 서비스
- 학위논문파일 제출
- 개인정보관리
- 원문복사 신청/조회
- 상호대차 신청/조회
- 게시판
- 전시마당

도서관안내
시설안내
정보마루안내
4F
전자자료 상세검색

전자자료 상세검색

통합검색
소장자료
전자자료

통합검색

결과내 검색

검색어 [키워드: "Medina, Nilberto H."]

총 99건

※ 중복 레코드가 제거된 검색 결과가 표시됩니다.

1/10 페이지

검색결과수정

검색범위확장
- Full Text내 키워드 확장
- 관련 주제어 확장
재검색
검색결과제한
- 원문(Full Text)
- Peer-Reviewed 학술지
- 발행년 -
재검색
자료유형
- Academic Journals (64)
- Conference Materials (28)
주제
- field programmable gate arrays (30)
- radiation (19)
- soft errors (17)
주제

Count Name
- field programmable gate arrays (30)
- radiation (19)
- soft errors (17)
- components, circuits, devices and systems (16)
- heavy ions (14)
- reliability (14)
- fault tolerance (13)
- field-programmable gate array (fpga) (12)
- gate array circuits (12)
- redundancy (12)
- electromagnetic interference (11)
- ions (11)
- hardware (10)
- program processors (10)
- aerospace (9)
- heavy ion (9)
- ionizing radiation (9)
- radiation effects (9)
- radioisotopes (9)
- reliability in engineering (9)
- sensitivity (9)
- signal processing and analysis (9)
- static random access memory (9)
- systems on a chip (9)
- analog-to-digital converters (8)
- random access memory (8)
- registers (8)
- reliability engineering (8)
- single-event effects (sees) (8)
- soft error (8)
- data acquisition systems (7)
- fpga (7)
- gamma ray spectrometry (7)
- single event effects (7)
- single event upsets (7)
- tools (7)
- benchmark testing (6)
- circuit faults (6)
- computer software (6)
- effective dose (6)
- electronic systems (6)
- fault injection (fi) (6)
- linear energy transfer (6)
- natural radionuclides (6)
- optimization (6)
- sram cells (6)
- x-ray (6)
- approximate computing (5)
- computing and processing (5)
- fault injection (5)
닫기
간행물
- ieee transactions on nuclear science (32)
- aip conference proceedings (14)
- journal of environmental radioactivity (8)
간행물

Count Name
- ieee transactions on nuclear science (32)
- aip conference proceedings (14)
- journal of environmental radioactivity (8)
- microelectronics reliability (6)
- journal of electronic testing (4)
- review of scientific instruments (4)
- 2015 15th european conference on radiation & its effects on components & systems (radecs) (2)
- 2015 15th european conference on radiation and its effects on components and systems (radecs), radiation and its effects on components and systems (radecs), 2015 15th european conference on (2)
- 2016 16th european conference on radiation and its effects on components and systems (radecs), radiation and its effects on components and systems (radecs), 2016 16th european conference on (2)
- 2017 18th ieee latin american test symposium (lats), test symposium (lats), 2017 18th ieee latin american (2)
- 2024 ieee 25th latin american test symposium (lats), latin american test symposium (lats), 2024 ieee 25th (2)
- journal of electronic testing: theory and applications (2)
- journal of electronic testing-theory and applications (2)
- universe (2)
- 2015 ieee radiation effects data workshop (redw) (1)
- 2015 ieee radiation effects data workshop (redw), radiation effects data workshop (redw), 2015 ieee (1)
- 2016 asia-pacific international symposium on electromagnetic compatibility (apemc) (1)
- 2016 asia-pacific international symposium on electromagnetic compatibility (apemc), electromagnetic compatibility (apemc), 2016 asia-pacific international symposium on (1)
- 2017 ieee radiation effects data workshop (redw), radiation effects data workshop (redw), 2017 ieee (1)
- 2018 18th european conference on radiation and its effects on components and systems (radecs), radiation and its effects on components and systems (radecs), 2018 18th european conference on (1)
- 2018 ieee international symposium on electromagnetic compatibility and 2018 ieee asia-pacific symposium on electromagnetic compatibility (emc/apemc), electromagnetic compatibility and 2018 ieee asia-pacific symposium on electromagnetic compatibility (emc/apemc), 2018 ieee international symposium on (1)
- 2019 19th european conference on radiation and its effects on components and systems (radecs), radiation and its effects on components and systems (radecs), 2019 19th european conference on (1)
- 2021 ieee 22nd latin american test symposium (lats), latin american test symposium (lats), 2021 ieee 22nd (1)
- 2021 ieee aerospace conference (50100), aerospace conference (50100), 2021 ieee (1)
- 2022 22nd european conference on radiation and its effects on components and systems (radecs), radiation and its effects on components and systems (radecs), 2022 22nd european conference on (1)
- acta physica hungarica new series heavy ion physics (1)
- epj web of conferences (1)
- international journal of modern physics a (1)
- journal of integrated circuits & systems (1)
닫기
출판사
- ieee (45)
- american institute of physics (17)
- ieee-inst electrical electronics engineers inc (8)
출판사

Count Name
- ieee (45)
- american institute of physics (17)
- ieee-inst electrical electronics engineers inc (8)
- elsevier b.v. (4)
- elsevier ltd (4)
- springer nature (4)
- elsevier applied science publishers (2)
- elsevier sci ltd (2)
- mdpi (2)
- pergamon-elsevier science ltd (2)
- springer (2)
- springer us (2)
- amer inst physics (1)
- brazilian microelectronics society (1)
- edp sciences (1)
- springer-verlag (1)
- world scientific publ co pte ltd (1)
닫기
언어
- english (82)
Publication Year
- 2018 (5)
- 2020 (5)
- 2014 (4)
Publication Year

Count Name
- 2018 (5)
- 2020 (5)
- 2014 (4)
- 2017 (4)
- 2019 (3)
- 2013 (2)
- 2016 (2)
- 2023 (2)
- 2008 (1)
- 2010 (1)
- 2021 (1)
닫기
수록데이터베이스
- Complementary Index (23)
- Academic Search Complete (22)
- Science Citation Index Expanded (18)
수록데이터베이스

Count Name
- Complementary Index (23)
- Academic Search Complete (22)
- Science Citation Index Expanded (18)
- IEEE Xplore Digital Library (17)
- Business Source Complete (8)
- ScienceDirect (4)
- MEDLINE (3)
- Springer Nature Journals (3)
- Directory of Open Access Journals (1)
닫기

PQDT
CAJ
RISS
PsycINFO

전체선택

Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection

회의자료

issue: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024
Author: Gobatto, Leonardo R.
Benevenuti, Fabio
Added, Nemitala
Alberton, Saulo G.
Macchione, Eduardo L. A.
Aguiar, Vitor A. P.
Medina, Nilberto H.
Kastensmidt, Fernanda L.
Azambuja, Jose Rodrigo
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Heavy Ion-Induced Faults on Programmable UART Controllers Embedded into SRAM-Based FPGA

회의자료

issue: 2024 IEEE 25th Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2024 IEEE 25th. :1-6 Apr, 2024
Author: Costa, Victor O.
Benevenuti, Fabio
Menezes, Renan
Sato, Lidia Shibuya
Loures, Luis
Kastensmidt, Fernanda L.
Added, Nemitala
Alberton, Saulo
Aguiar, Vitor A. P.
Medina, Nilberto H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Alpha Particle- and Neutron-Induced Single-Event Effects in COTS Power FETS

회의자료

issue: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2022 22nd European Conference on. :1-4 Oct, 2022
Author: Alberton, Saulo G.
Boas, Alexis C. V.
Medina, Nilberto H.
Guazzelli, Marcilei A.
Aguiar, Vitor A. P.
Added, Nemitala
Federico, Claudio A.
Goncalez, Odair L.
Cavalcante, Tassio C.
Pereira Junior, Evaldo C. F.
Vaz, Rafael G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Reliability Evaluation of Voters for Fault Tolerant Approximate Systems

회의자료

issue: 2021 IEEE 22nd Latin American Test Symposium (LATS) Latin American Test Symposium (LATS), 2021 IEEE 22nd. :1-6 Oct, 2021
Author: Balen, Tiago R.
Gonzalez, Carlos J.
Oliveira, Ingrid F. V.
Schvittz, Rafael B.
Added, Nemitala
Macchione, Eduardo L. A.
Aguiar, Vitor A. P.
Guazzelli, Marcilei A.
Medina, Nilberto H.
Butzen, Paulo F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Single Event Analysis on SRAM 180nm CMOS Memory with Super Voter Protection Technique

회의자료

issue: 2021 IEEE Aerospace Conference (50100) Aerospace Conference (50100), 2021 IEEE. :1-9 Mar, 2021
Author: dos Santos, Angela Alves
Deucher, Alexsander
de Lazari, Daniel B.
Castro, Felipe
Solano, Jorge
Seixas, Luis Eduardo
Medina, Nilberto H.
Aguiar, Vitor A. P.
Added, Nemitala
Manea, Silvio
Finco, Saulo
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Evaluating the Reliability of Different Voting Schemes for Fault Tolerant Approximate Systems

학술저널

issue: Journal of Electronic Testing: Theory and Applications. 39(4):409-420
Author: Balen, Tiago R.^{Aff1, IDs10836023060729_cor1}
González, Carlos J.
Oliveira, Ingrid F. V.
da Rosa Jr, Leomar S.
Soares, Rafael I.
Schvittz, Rafael B.
Added, Nemitala
Macchione, Eduardo L. A.
Aguiar, Vitor A. P.
Guazzelli, Marcilei A.
Medina, Nilberto H.
Butzen, Paulo F.
DB Label: Database : Springer Nature Journals

원문보기: 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - RISS

Heavy Ions Testing of an All-Convolutional Neural Network for Image Classification Evolved by Genetic Algorithms and Implemented on SRAM-Based FPGA

회의자료

issue: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2019 19th European Conference on. :1-4 Sep, 2019
Author: Benevenuti, Fabio
de Oliveira, Adria B.
Lopes, Israel C.
Kastensmidt, Fernanda L.
Added, Nemitala
Aguiar, Vitor A. P.
Medina, Nilberto H.
Guazzelli, Marcilei A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Analyzing the Influence of using Reconfiguration Memory Scrubber and Hardware Redundancy in a Radiation Hardened FPGA under Heavy Ions

회의자료

issue: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2018 18th European Conference on. :1-4 Sep, 2018
Author: de Oliveira, Adria B.
Benevenuti, Fabio
Benites, Luis A. C.
Rodrigues, Gennaro S.
Kastensmidt, Fernanda L.
Added, Nemitala
Aguiar, Vitor A.P.
Medina, Nilberto H.
Silveira, Marcilei A.G.
Debarge, Cedric
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Analysis of conducted-EMI noise influence on the effectiveness of an EDAC technique to mitigate soft errors in ionizing radiation environment

회의자료

issue: 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC), 2018 IEEE International Symposium on. :303-308 May, 2018
Author: Goerl, Roger
Villa, Paulo
Vargas, Fabian
Medina, Nilberto H.
Added, Nemitala
de Aguiar, Vitor A. P.
da Silveira, Marcilei A. G.
Bezerra, Eduardo
DB Label: Database : IEEE Xplore Digital Library