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CorCA: An Automatic Program Repair Tool for Checking and Removing Effectively C Flaws

회의자료

issue: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2023 IEEE Conference on. :71-82 Apr, 2023
Author: Inacio, Joao
Medeiros, Iberia
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Towards PHP Vulnerability Detection at an Intermediate Language Level

회의자료

issue: 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) DSN-S Dependable Systems and Networks - Supplemental Volume (DSN-S), 2023 53rd Annual IEEE/IFIP International Conference on. :182-184 Jun, 2023
Author: Antunes, Paulo
Medeiros, Iberia
Neves, Nuno
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Fast Abstracts and Student Forum Proceedings, 18th European Dependable Computing Conference -- EDCC 2022

보고서

Author: Medeiros, Ibéria
Deconinck, Geert
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Towards a Deep Learning Model for Vulnerability Detection on Web Application Variants

회의자료

issue: 2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Software Testing, Verification and Validation Workshops (ICSTW), 2020 IEEE International Conference on. :465-476 Oct, 2020
Author: Fidalgo, Ana
Medeiros, Iberia
Antunes, Paulo
Neves, Nuno
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Generating Tests for the Discovery of Security Flaws in Product Variants

회의자료

issue: 2020 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Software Testing, Verification and Validation Workshops (ICSTW), 2020 IEEE International Conference on. :133-142 Oct, 2020
Author: Araujo, Francisco
Medeiros, Iberia
Neves, Nuno
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Effect of Coding Styles in Detection of Web Application Vulnerabilities

회의자료

issue: 2020 16th European Dependable Computing Conference (EDCC) EDCC Dependable Computing Conference (EDCC), 2020 16th European. :111-118 Sep, 2020
Author: Medeiros, Iberia
Neves, Nuno
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Effectiveness on C Flaws Checking and Removal

회의자료

issue: 2022 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks - Supplemental Volume (DSN-S) DSN-S Dependable Systems and Networks - Supplemental Volume (DSN-S), 2022 52nd Annual IEEE/IFIP International Conference on. :33-34 Jun, 2022
Author: Inacio, Joao
Medeiros, Iberia
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

SLICER: Safe Long-Term Cloud Event Archival

회의자료

issue: 2019 IEEE 24th Pacific Rim International Symposium on Dependable Computing (PRDC) PRDC Dependable Computing (PRDC), 2019 IEEE 24th Pacific Rim International Symposium on. :43-4309 Dec, 2019
Author: Serckumecka, Adriano
Medeiros, Iberia
Ferreira, Bernardo
Bessani, Alysson
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Low-Cost Serverless SIEM in the Cloud

회의자료

issue: 2019 38th Symposium on Reliable Distributed Systems (SRDS) SRDS Reliable Distributed Systems (SRDS), 2019 38th Symposium on. :381-3811 Oct, 2019
Author: Serckumecka, Adriano
Medeiros, Iberia
Bessani, Alysson
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

PURE: Generating Quality Threat Intelligence by Clustering and Correlating OSINT

회의자료

issue: 2019 18th IEEE International Conference On Trust, Security And Privacy In Computing And Communications/13th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE) Trust, Security And Privacy In Computing And Communications/13th IEEE International Conference On Big Data Science And Engineering (TrustCom/BigDataSE), 2019 18th IEEE International Conference On. :483-490 Aug, 2019
Author: Azevedo, Rui
Medeiros, Iberia
Bessani, Alysson
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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