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1

학술저널

issue
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 34(3):1-4 May, 2024
Author
Elwakeel, A.
McNeill, N.
Alzola, R.P.
Surapaneni, R.K.
Galla, G.
Ybanez, L.
Zhang, M.
Yuan, W.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

학술저널

issue
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 32(6):1-5 Sep, 2022
Author
Elwakeel, A.
McNeill, N.
Pena-Alzola, R.
Zhang, M.
Yuan, W.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

학술저널

issue
IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 31(5):1-5 Aug, 2021
Author
Elwakeel, A.
Feng, Z.
McNeill, N.
Zhang, M.
Williams, B.
Yuan, W.
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

학술저널

issue
IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 36(7):8267-8279 Jul, 2021
Author
Liu, D.
Dymond, H.C.P.
Hollis, S.J.
Wang, J.
McNeill, N.
Pamunuwa, D.
Stark, B.H.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

학술저널

issue
IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 67(9):7179-7189 Sep, 2020
Author
McNeill, N.
Jin, B.
Yuan, X.
Laird, I.
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2013 Twenty-Eighth Annual IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2013 Twenty-Eighth Annual IEEE. :3081-3086 Mar, 2013
Author
Proynov, P. P.
Szarka, G. D.
Stark, B. H.
McNeill, N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2012 Twenty-Seventh Annual IEEE Applied Power Electronics Conference and Exposition (APEC) Applied Power Electronics Conference and Exposition (APEC), 2012 Twenty-Seventh Annual IEEE. :667-674 Feb, 2012
Author
Proynov, P. P.
Szarka, G. D.
Stark, B. H.
McNeill, N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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