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회의자료

issue
2023 2nd International Conference on Artificial Intelligence and Computer Information Technology (AICIT) Artificial Intelligence and Computer Information Technology (AICIT), 2023 2nd International Conference on. :1-5 Sep, 2023
Author
Yang, Shubin
Yuan, Mengze
Huang, Jiben
Tang, Wansha
Wang, Feng
Liu, Ri
DB Label
Database : IEEE Xplore Digital Library
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4

회의자료

issue
2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :9-12 Jul, 2023
Author
Saeed, Sadaf
Zia, Ali
Liu, Ri
Liu, Dongdong
Cao, Liang
Wang, Zuobin
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2023 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2023 IEEE International Conference on. :267-271 Jul, 2023
Author
Li, Wenjun
Zeng, Huanghao
Liu, Ri
Kong, Fanyue
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2022 34th Chinese Control and Decision Conference (CCDC) Control and Decision Conference (CCDC), 2022 34th Chinese. :4737-4744 Aug, 2022
Author
Zhao, Yongsheng
Liu, Ri
Chen, Xinyu
Fan, Yunsheng
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2022 IEEE International Conference on. :443-446 Aug, 2022
Author
Liu, Dongdong
Liu, Ri
Saeed, Sadaf
Wang, Zuobin
Dong, Litong
Bryanston-Cross, Peter
DB Label
Database : IEEE Xplore Digital Library
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9

회의자료

issue
2022 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2022 IEEE International Conference on. :568-571 Aug, 2022
Author
Saeed, Sadaf
Liu, Ri
Gao, Mingyan
Liu, Dongdong
Wang, Zuobin
Zia, Ali
DB Label
Database : IEEE Xplore Digital Library
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