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전체선택

Heavily Doped Channel Carrier Mobility in β-Ga2O3 Lateral Accumulation MOSFET

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):3429-3432 May, 2024
Author: Kuk, S.
Choi, S.
Kim, H.Y.
Ko, K.
Jeong, J.
Geum, D.
Han, J.
Park, J.
Jeon, D.
Kim, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Large Polarization of Hf₀.₅Zr₀.₅Oₓ Ferroelectric Film on InGaAs With Electric-Field Cycling and Annealing Temperature Engineering

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(5):766-769 May, 2024
Author: Suh, Y.
Jeong, J.
Kim, B.H.
Kuk, S.
Kim, S.K.
Kim, J.P.
Kim, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Examination of Ferroelectric FET for “Cold” Nonvolatile Memory

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4122-4127 Aug, 2023
Author: Kuk, S.
Han, S.
Kim, B.H.
Kim, J.P.
Kim, S.
Ahn, S.
Park, M.H.
Han, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Effect of Scandium Insertion Into the Gate-Stack of Ferroelectric Field-Effect Transistors

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(4):1996-2000 Apr, 2023
Author: Kim, B.H.
Kuk, S.
Kim, S.K.
Kim, J.P.
Suh, Y.
Jeong, J.
Geum, D.
Baek, S.
Kim, S.H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Logic and Memory Ferroelectric Field-Effect-Transistor Using Reversible and Irreversible Domain Wall Polarization

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(1):36-39 Jan, 2023
Author: Kuk, S.
Han, S.
Lee, D.H.
Kim, B.H.
Shim, J.
Park, M.H.
Han, J.
Kim, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

An Investigation of HZO-Based n/p-FeFET Operation Mechanism and Improved Device Performance by the Electron Detrapping Mode

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(4):2080-2087 Apr, 2022
Author: Kuk, S.
Han, S.
Kim, B.H.
Baek, S.
Han, J.
Kim, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A Smartphone Magnetometer-Based Diagnostic Test for Automatic Contact Tracing in Infectious Disease Epidemics

학술저널

issue: IEEE Access Access, IEEE. 7:20734-20747 2019
Author: Jeong, S.
Kuk, S.
Kim, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A Feasibility Study and Development Framework Design for Realizing Smartphone-Based Vehicular Networking Systems

학술저널

issue: IEEE Transactions on Mobile Computing IEEE Trans. on Mobile Comput. Mobile Computing, IEEE Transactions on. 13(11):2431-2444 Nov, 2014
Author: Park, Y.
Ha, J.
Kuk, S.
Kim, H.
Liang, C.-J. M.
Ko, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Light-Induced Hysteresis of In–Ga–Zn–O Thin-Film Transistors With Various Temperatures

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(9):1279-1281 Sep, 2012
Author: Kuk, S.-H.
Lee, S.-Y.
Kim, S.-J.
Kim, B.
Park, S.-J.
Kwon, J.-Y.
Han, M.-K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A Novel Depletion-Mode a-IGZO TFT Shift Register With a Node-Shared Structure

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(7):1003-1005 Jul, 2012
Author: Kim, B.
Cho, H. N.
Choi, W. S.
Kuk, S.-H.
Yoo, J.-S.
Yoon, S. Y.
Jun, M.
Hwang, Y.-K.
Han, M.-K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

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