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1

회의자료

issue
2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2023 IEEE 73rd. :1027-1031 May, 2023
Author
Jang, Heejun
Ahn, Kyun
Park, Haesung
Yong, Gamhan
Kim, Jihyun
Jeong, YeonKi
Sohn, EunSook
Hiner, Dave
Kelly, Mike
Hwang, Taekyeong
Do, Wonchul
Khim, JinYoung
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

전자책

issue
Principles of Nursing in Kidney Care : Under the Auspices of EDTNA/ERCA and EKPF. :293-298
Author
Kelly, MikeAff4, Aff5
DB Label
Database : Springer Nature eBooks
원문보기
5

회의자료

issue
2021 IEEE 71st Electronic Components and Technology Conference (ECTC) ECTC Electronic Components and Technology Conference (ECTC), 2021 IEEE 71st. :96-100 Jun, 2021
Author
Lee, JiHun
Yong, GamHan
Jeong, MinSu
Jeon, JongHyun
Han, DongHoon
Lee, MinKeon
Do, WonChul
Sohn, EunSook
Kelly, Mike
Hiner, Dave
Khim, JinYoung
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2020 IEEE 70th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2020 IEEE 70th. :885-892 Jun, 2020
Author
Scott, George J.
Bae, JaeHun
Yang, KiYeul
Ki, WonMyoung
Whitchurch, Nathan
Kelly, Mike
Zwenger, Curtis
Jeon, JongHyun
Hwang, TaeKyeong
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2020 IEEE 70th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2020 IEEE 70th. :1332-1337 Jun, 2020
Author
Choi, MiKyeong
Jung, HyunHye
Oh, KwangSeok
Ryu, DongSu
Lee, SangHyoun
Do, WonChul
Kweon, YoungDo
Kelly, Mike
Park, KyungRok
Khim, JinYoung
Huemoeller, Ron
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2019 IEEE 69th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2019 IEEE 69th. :163-167 May, 2019
Author
Dias, Rajen
Kelly, Mike
Balaraman, Devarajan
Shoji, Hideaki
Shiraiwa, Tomio
Oh, KwangSeok
Park, JoonYoung
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2018 34th Thermal Measurement, Modeling & Management Symposium (SEMI-THERM) Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th. :21-25 Mar, 2018
Author
Kelly, Mike
Fosnot, Phillip
Wei, Jonathan
Min, Max
Galloway, Jesse
DB Label
Database : IEEE Xplore Digital Library
원문보기
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