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전체선택

La Doped HZO-Based 3D-Trench Metal-Ferroelectric-Metal Capacitors With High-Endurance (>10¹²) for FeRAM Applications

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(4):578-581 Apr, 2024
Author: Walke, A.M.
Popovici, M.I.
Sharifi, S.H.
Demir, E.C.
Puliyalil, H.
Bizindavyi, J.
Yasin, F.
Clima, S.
Fantini, A.
Belmonte, A.
Kar, G.S.
Houdt, J.V.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Scaling the SOT track – A path towards maximizing efficiency in SOT-MRAM

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Van Beek, S.
Cai, K.
Yasin, F.
Hody, H.
Talmelli, G.
Nguyen, V.D.
Vergel, N. Franchina
Palomino, A.
Trovato, A.
Wostyn, K.
Rao, S.
Kar, G.S.
Couet, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Magnetic Domain Wall Memory: A DTCO study for Memory Applications

회의자료

issue: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :41-44 Sep, 2023
Author: Gupta, M.
Rao, S.
Kar, G.S.
Couet, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

The Impact of IGZO Channel Composition on DRAM Transistor Performance

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(9):4674-4679 Sep, 2023
Author: Kruv, A.
Van Setten, M.J.
Dekkers, H.F.W.
Lorant, C.
Verreck, D.
Smets, Q.
Venkataramana, B.Y.
Belmonte, A.
Subhechha, S.
Chasin, A.V.
Delhougne, R.
Kar, G.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Degradation Mapping and Impact of Device Dimension on IGZO TFTs BTI

학술저널

issue: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):337-345 Sep, 2023
Author: Rinaudo, P.
Chasin, A.
Franco, J.
Wu, Z.
Subhechha, S.
Arutchelvan, G.
Eneman, G.
Ramana, B.Y.V.
Rassoul, N.
Delhougne, R.
Kaczer, B.
De Wolf, I.
Kar, G.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Fault Attack Investigation on TaOx Resistive-RAM for Cyber Secure Application

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(8):4170-4177 Aug, 2023
Author: Kumar, A.
Degraeve, R.
Beckers, A.
Fantini, A.
Verbauwhede, I.
Linten, D.
Kar, G.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Self-Rectifying Memory Cell Based on SiGeAsSe Ovonic Threshold Switch

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(5):2276-2281 May, 2023
Author: Ravsher, T.
Garbin, D.
Fantini, A.
Degraeve, R.
Clima, S.
Donadio, G.L.
Kundu, S.
Hody, H.
Devulder, W.
Van Houdt, J.
Afanas'ev, V.
Delhougne, R.
Kar, G.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

A HydroDynamic Model for Trap-Assisted Tunneling Conduction in Ovonic Devices

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(4):1808-1814 Apr, 2023
Author: Buscemi, F.
Piccinini, E.
Vandelli, L.
Nardi, F.
Padovani, A.
Kaczer, B.
Garbin, D.
Clima, S.
Degraeve, R.
Kar, G.S.
Tavanti, F.
Slassi, A.
Calzolari, A.
Larcher, L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

NPN SiGe Hetero Junction Transistor Latch-Up Memory Selector

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(4):614-617 Apr, 2023
Author: Hiblot, G.
Ravsher, T.
Loo, R.
Ramana, B.Y.V.
Canvel, Y.
Vergel, N.F.
Fantini, A.
Sharifi, S.H.
Bazzazian, N.
Ayyad, M.
Merkulov, A.
Kar, G.S.
Couet, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Degradation mapping of IGZO TFTs

회의자료

issue: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022
Author: Rinaudo, P.
Chasin, A.
Franco, J.
Wu, Z.
Rassoul, N.
Delhougne, R.
Kaczer, B.
Wolf, I. De
Kar, G.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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