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1
Ablation Analysis for Multi-Device Deep Learning-Based Physical Side-Channel Analysis 미리보기

학술저널

issue
IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 21(3):1331-1341 Jun, 2024
Author
Wu, L.
Won, Y.
Jap, D.
Perin, G.
Bhasin, S.
Picek, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
2
SNIFF: Reverse Engineering of Neural Networks With Fault Attacks 미리보기

학술저널

issue
IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 71(4):1527-1539 Dec, 2022
Author
Breier, J.
Jap, D.
Hou, X.
Bhasin, S.
Liu, Y.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
3
SCA Strikes Back: Reverse-Engineering Neural Network Architectures Using Side Channels 미리보기

학술저널

issue
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 39(4):7-14 Aug, 2022
Author
Batina, L.
Bhasin, S.
Jap, D.
Picek, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
5
Back to the Basics: Seamless Integration of Side-Channel Pre-Processing in Deep Neural Networks 미리보기

학술저널

issue
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 16:3215-3227 2021
Author
Won, Y.
Hou, X.
Jap, D.
Breier, J.
Bhasin, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
6
On Side Channel Vulnerabilities of Bit Permutations in Cryptographic Algorithms 미리보기

학술저널

issue
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 15:1072-1085 2020
Author
Breier, J.
Jap, D.
Hou, X.
Bhasin, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
7
A Framework to Counter Statistical Ineffective Fault Analysis of Block Ciphers Using Domain Transformation and Error Correction 미리보기

학술저널

issue
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 15:1905-1919 2020
Author
Saha, S.
Jap, D.
Basu Roy, D.
Chakraborty, A.
Bhasin, S.
Mukhopadhyay, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
8
SCADFA: Combined SCA+DFA Attacks on Block Ciphers with Practical Validations 미리보기

학술저널

issue
IEEE Transactions on Computers IEEE Trans. Comput. Computers, IEEE Transactions on. 68(10):1498-1510 Oct, 2019
Author
Patranabis, S.
Datta, N.
Jap, D.
Breier, J.
Bhasin, S.
Mukhopadhyay, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
9
Automatic Characterization of Exploitable Faults: A Machine Learning Approach 미리보기

학술저널

issue
IEEE Transactions on Information Forensics and Security IEEE Trans.Inform.Forensic Secur. Information Forensics and Security, IEEE Transactions on. 14(4):954-968 Apr, 2019
Author
Saha, S.
Jap, D.
Patranabis, S.
Mukhopadhyay, D.
Bhasin, S.
Dasgupta, P.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
10
Toward Threat of Implementation Attacks on Substation Security: Case Study on Fault Detection and Isolation 미리보기

학술저널

issue
IEEE Transactions on Industrial Informatics IEEE Trans. Ind. Inf. Industrial Informatics, IEEE Transactions on. 14(6):2442-2451 Jun, 2018
Author
Chattopadhyay, A.
Ukil, A.
Jap, D.
Bhasin, S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR)  원문복사신청 - FRIC 
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