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2

회의자료

issue
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2012 19th IEEE International Symposium on the. :1-6 Jul, 2012
Author
Gambino, J. P.
Malinowski, J.
Cote, A.
Guthrie, B.
Chapman, P.
Vize, A.
Bowe, W.
Griffin, C.
Cooney, E.
Aoki, T.
Chen, Y.
Wang, D.
Jaffe, M.
DB Label
Database : IEEE Xplore Digital Library
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3

회의자료

issue
2018 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2018 IEEE International. :P-TX.2-1-P-TX.2-3 Mar, 2018
Author
Ioannou, D. P.
Tan, Y.
Logan, R.
Bandy, K.
Achanta, R.
Wang, P.C.
Brochu, D.
Jaffe, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2011 IEEE/AIAA 30th Digital Avionics Systems Conference Digital Avionics Systems Conference (DASC), 2011 IEEE/AIAA 30th. :1-15 Oct, 2011
Author
Jaffe, M. S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2015 IEEE 15th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems Silicon Monolithic Integrated Circuits in RF Systems (SiRF), 2015 IEEE 15th Topical Meeting on. :30-32 Jan, 2015
Author
Jaffe, M.
Abou-Khalil, M.
Botula, A.
Ellis-Monaghan, J.
Gambino, J.
Gross, J.
He, Z.-X.
Joseph, A.
Phelps, R.
Shank, S.
Slinkman, J.
Wolf, R.
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

학술저널

issue
Journal of Assisted Reproduction and Genetics: An Official Journal of the American Society for Reproductive Medicine. 37(4):777-787
Author
Pini, T.Aff1, IDs10815020017078_cor1
Parks, J.
Russ, J.
Dzieciatkowska, M.
Hansen, K. C.
Schoolcraft, W. B.
Katz-Jaffe, M.
DB Label
Database : Springer Nature Journals
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8

회의자료

issue
2006 International Electron Devices Meeting Electron Devices Meeting, 2006. IEDM '06. International. :1-4 Dec, 2006
Author
Gambino, J.
Leidy, B.
Adkisson, J.
Jaffe, M.
Rassel, R. J.
Wynne, J.
Ellis-Monaghan, J.
Hoague, T.
Meatyard, D.
Mongeon, S.
Kryzak, T.
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2006 13th International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits, 2006. 13th International Symposium on the. :235-238 Jul, 2006
Author
Rassel, R.J.
Guthrie, W.
Gambino, J.
Maloney, J.J.
Stidham, M.
Sprogis, E.
Adkisson, J.W.
Jaffe, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
1992 International Technical Digest on Electron Devices Meeting Electron Devices Meeting, 1992. IEDM '92. Technical Digest., International. :155-158 1992
Author
Mii, T.
Kleinhenz, R.
Noble, W.
Johnson, J.
Bryant, A.
Jaffe, M.
DB Label
Database : IEEE Xplore Digital Library
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