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Gamma radiation tests of radiation-hardened fiber Bragg grating based sensors for radiation environments

회의자료

issue: 2016 16th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Radiation and Its Effects on Components and Systems (RADECS), 2016 16th European Conference on. :1-4 Sep, 2016
Author: Kuhnhenn, J.
Weinand, U.
Morana, A.
Girard, S.
Marin, E.
Perisse, J.
Genot, J. S.
Grelin, J.
Hutter, L.
Melin, G.
Lablonde, L.
Robin, T.
Cadier, B.
Mace, J.-R.
Boukenter, A.
Ouerdane, Y.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

The impact of oxygen insertion technology on SRAM yield performance

회의자료

issue: 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :191-192 Feb, 2017
Author: Marshall, A.
Nimmalapudi, S.
Loh, W. K.
Krick, J.
Hutter, L.
Takeuchi, H.
Stephenson, R.
Mears, R. J.
Ikeda, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Gamma Radiation Tests of Radiation-Hardened Fiber Bragg Grating-Based Sensors for Radiation Environments

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 64(8):2307-2311 Aug, 2017
Author: Kuhnhenn, J.
Weinand, U.
Morana, A.
Girard, S.
Marin, E.
Perisse, J.
Genot, J.S.
Grelin, J.
Hutter, L.
Melin, G.
Lablonde, L.
Robin, T.
Cadier, B.
Mace, J.-.
Boukenter, A.
Ouerdane, Y.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

LeadFrameOnChip offers integrated power bus and bond over active circuit

회의자료

issue: Proceedings of the 13th International Symposium on Power Semiconductor Devices & ICs. IPSD '01 (IEEE Cat. No.01CH37216) Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 2001. ISPSD '01. Proceedings of the 13th International Symposium on. :65-68 2001
Author: Efland, T.
Abbott, D.
Arellano, V.
Buschbom, M.
Chang, W.
Hoffart, C.
Hutter, L.
Mai, Q.
Nishimura, I.
Pendharkar, S.
Pierce, M.
Shen, C.C.
Thee, C.M.
Vanhorn, H.
Williams, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A highly manufacturable 0.25/spl mu/m RF technology utilizing a unique SiGe integration

회의자료

issue: Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, Proceedings of the 2001. :56-59 2001
Author: Johnson, F.S.
Ai, J.
Dunn, S.
El Kareh, B.
Erdeljac, J.
John, S.
Benaissa, K.
Bellaour, A.
Benna, B.
Hodgson, L.
Hoffleisch, G.
Hutter, L.
Jaumann, M.
Jumpertz, R.
Mercer, M.
Nair, M.
Seitchik, J.
Shen, C.
Schiekofer, M.
Scharnagl, T.
Schimpf, K.
Schulz, U.
Staufer, B.
Stroth, L.
Tatman, D.
Thompson, M.
Williams, B.
Violette, K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

The optimization of LBC6 power/mixed-signal IC BiCMOS process

회의자료

issue: Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, Proceedings of the 2001. :192-195 2001
Author: Nehrer, W.
Brito, J.C.
DeBolske, T.
Efland, T.
Fleischmann, P.
Hannaman, D.
Higgins, R.
Hutter, L.
McNutt, M.
Mindricelu, E.
Pendharkar, S.
Smith, J.
Taylor, R.V.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A study of boron doping profile control for a low V/sub t/ device used in the advanced low power, high speed mixed-signal IC

회의자료

issue: IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168) Semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI. :423-426 1998
Author: Chen, A.
Flessner, K.
Sana, P.
Dixon, R.
Malone, F.
Ying, P.
Hutter, L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Radiation-Hardened Fiber Bragg Grating Based Sensors for Harsh Environments

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 64(1):68-73 Jan, 2017
Author: Morana, A.
Girard, S.
Marin, E.
Perisse, J.
Genot, J.
Kuhnhenn, J.
Grelin, J.
Hutter, L.
Melin, G.
Lablonde, L.
Robin, T.
Cadier, B.
Mace, J.
Boukenter, A.
Ouerdane, Y.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

A performance comparison between new reduced surface drain "RSD" LDMOS and RESURF and conventional planar power devices rated at 20 V

회의자료

issue: Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's Power semiconductor devices and ICs Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on. :185-188 1997
Author: Efland, T.
Tsai, C.-Y.
Erdeljac, J.
Mitros, J.
Hutter, L.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A dual-slot power-interface switch for PCMCIA controllers using a novel bi-directional switching concept, built in a 1 /spl mu/m BiCMOS/DMOS power process

회의자료

issue: Proceedings of 9th International Symposium on Power Semiconductor Devices and IC's Power semiconductor devices and ICs Power Semiconductor Devices and IC's, 1997. ISPSD '97., 1997 IEEE International Symposium on. :341-344 1997
Author: Corsi, M.
Erdeljac, J.
Hutter, L.
Sanders, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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