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전체선택

Space Efficient Sequence Alignment for SRAM-Based Computing: X-Drop on the Graphcore IPU

회의자료

issue: SC23: International Conference for High Performance Computing, Networking, Storage and Analysis High Performance Computing, Networking, Storage and Analysis, SC23: International Conference for. :1-16 Nov, 2023
Author: Burchard, Luk
Zhao, Max Xiaohang
Langguth, Johannes
Buluc, Aydin
Guidi, Giulia
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Designing Efficient SIMD Kernels for High Performance Sequence Alignment

회의자료

issue: 2023 IEEE International Parallel and Distributed Processing Symposium Workshops (IPDPSW) IPDPSW Parallel and Distributed Processing Symposium Workshops (IPDPSW), 2023 IEEE International. :167-176 May, 2023
Author: Popovici, Doru Thom
Awan, Muaaz Gul
Guidi, Giulia
Egan, Rob
Hofmeyr, Steven
Oliker, Leonid
Yelick, Katherine
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Extreme-scale many-against-many protein similarity search

보고서

issue: SC'22: Proceedings of the International Conference on High Performance Computing, Networking, Storage and Analysis, 2022
Author: Selvitopi, Oguz
Ekanayake, Saliya
Guidi, Giulia
Awan, Muaaz G.
Pavlopoulos, Georgios A.
Azad, Ariful
Kyrpides, Nikos
Oliker, Leonid
Yelick, Katherine
Buluç, Aydın
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Extreme-Scale Many-against-Many Protein Similarity Search

회의자료

issue: SC22: International Conference for High Performance Computing, Networking, Storage and Analysis SC High Performance Computing, Networking, Storage and Analysis, SC22: International Conference for. :1-12 Nov, 2022
Author: Selvitopi, Oguz
Ekanayake, Saliya
Guidi, Giulia
Awan, Muaaz G.
Pavlopoulos, Georgios A.
Azad, Ariful
Kyrpides, Nikos
Oliker, Leonid
Yelick, Katherine
Buluc, Aydin
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Analysis of non-ideal remote pole in Electrical Resistivity Tomography for subsurface surveys

회의자료

issue: 2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2022 IEEE International. :1-5 May, 2022
Author: Patrizi, Gabriele
Guidi, Giulia
Ciani, Lorenzo
Catelani, Marcantonio
Cappuccini, Luca
Innocenti, Agnese
Casagli, Nicola
Pazzi, Veronica
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Distributed-Memory Parallel Contig Generation for De Novo Long-Read Genome Assembly

보고서

issue: ICPP22, August 29-September 1, 2022, Bordeaux, France
Author: Guidi, Giulia
Raulet, Gabriel
Rokhsar, Daniel
Oliker, Leonid
Yelick, Katherine
Buluc, Aydin
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Reliability Allocation: an iterative approach for complex systems

회의자료

issue: 2021 IEEE International Symposium on Systems Engineering (ISSE) Systems Engineering (ISSE), 2021 IEEE International Symposium on. :1-6 Sep, 2021
Author: Catelani, Marcantonio
Ciani, Lorenzo
Guidi, Giulia
Patrizi, Gabriele
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Reliability Analysis of diagnostic system for Condition Monitoring of industrial plant

회의자료

issue: 2021 IEEE 6th International Forum on Research and Technology for Society and Industry (RTSI) Research and Technology for Society and Industry (RTSI), 2021 IEEE 6th International Forum on. :323-328 Sep, 2021
Author: Catelani, Marcantonio
Ciani, Lorenzo
Guidi, Giulia
Patrizi, Gabriele
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Effect of Pulses Distribution in a Buck Converter Controlled with Pulse Skipping Modulation

회의자료

issue: 2021 IEEE 15th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) Compatibility, Power Electronics and Power Engineering (CPE-POWERENG), 2021 IEEE 15th International Conference on. :1-6 Jul, 2021
Author: Ciani, Lorenzo
Catelani, Marcantonio
Bartolini, Alessandro
Corti, Fabio
Guidi, Giulia
Patrizi, Gabriele
Reatti, Alberto
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Accelerated Testing and Reliability estimation of electronic boards for automotive applications

회의자료

issue: 2021 IEEE International Workshop on Metrology for Automotive (MetroAutomotive) Metrology for Automotive (MetroAutomotive), 2021 IEEE International Workshop on. :199-204 Jul, 2021
Author: Catelani, Marcantonio
Ciani, Lorenzo
Guidi, Giulia
Patrizi, Gabriele
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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