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Updated history of the electrostatic processes committee of the IAS

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issue: 2014 IEEE Industry Application Society Annual Meeting Industry Applications Society Annual Meeting, 2014 IEEE. :1-4 Oct, 2014
Author: Castle, G S Peter
Greason, William D
DB Label: Database : IEEE Xplore Digital Library

Triboelectrification of wood

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issue: 2011 IEEE Industry Applications Society Annual Meeting Industry Applications Society Annual Meeting (IAS), 2011 IEEE. :1-5 Oct, 2011
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Analysis of space charge effects due to ESD in MEMS

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issue: EOS/ESD Symposium Proceedings Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2011 33rd. :1-7 Sep, 2011
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Analysis of dynamic effects of charge injection due to ESD in MEMS

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issue: Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2010 Electrical Overstress/ Electrostatic Discharge Symposium (EOS/ESD), 2010 32nd. :1-8 Oct, 2010
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Measurement Methodologies for Analysis of Electrostatic Discharge (ESD) Events in Multi-Body Problems

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issue: 2010 IEEE Industry Applications Society Annual Meeting Industry Applications Society Annual Meeting (IAS), 2010 IEEE. :1-6 Oct, 2010
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Modeling the effect of charge injection due to ESD in MEMS

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issue: 2009 31st EOS/ESD Symposium EOS/ESD Symposium, 2009 31st. :1-7 Aug, 2009
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Analysis of the Effect of ESD on the Operation of MEMs

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issue: 2008 IEEE Industry Applications Society Annual Meeting Industry Applications Society Annual Meeting, 2008. IAS '08. IEEE. :1-7 Oct, 2008
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Analysis of charged device model (CDM) ESD in MEMS

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issue: EOS/ESD 2008 - 2008 30th Electrical Overstress/Electrostatic Discharge Symposium Electrical Overstress/Electrostatic Discharge Symposium, 2008. EOS/ESD 2008. 30th. :281-289 Sep, 2008
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Enhanced student evaluation software in engineering and science courses

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issue: 2007 37th Annual Frontiers In Education Conference - Global Engineering: Knowledge Without Borders, Opportunities Without Passports Frontiers In Education Conference - Global Engineering: Knowledge Without Borders, Opportunities Without Passports, 2007. FIE '07. 37th Annual. :T2G-1-T2G-6 Oct, 2007
Author: Doyle, Thomas E.
Ieta, Adrian
Kucerovsky, Zdenek
Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

Effect of Charge Injection Due to ESD on the Operation of MEMS

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issue: 2007 IEEE Industry Applications Annual Meeting Industry Applications Conference, 2007. 42nd IAS Annual Meeting. Conference Record of the 2007 IEEE. :2188-2193 Sep, 2007
Author: Greason, William D.
DB Label: Database : IEEE Xplore Digital Library

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