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전체선택

Experimental analysis of variability in WS$_2$-based devices for hardware security

보고서

issue: Solid-State Electronics 2023
Author: Vatalaro, M.
Neill, H.
Gity, F.
Magnone, P.
Maccaronio, V.
Márquez, C.
Galdon, J. C.
Gamiz, F.
Crupi, F.
Hurley, P.
De Rose, R.
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Influence of Punch Trough Stop Layer and Well Depths on the Robustness of Bulk FinFETs to Heavy Ions Impact

학술저널

issue: IEEE Access Access, IEEE. 10:47169-47178 2022
Author: Calomarde, A.
Manich, S.
Rubio, A.
Gamiz, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS

CVD-grown back-gated MoS2 transistors

회의자료

issue: 2020 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2020 Joint International EUROSOI Workshop and International Conference on. :1-4 Sep, 2020
Author: Marquez, C.
Salazar, N.
Gity, F.
Navarro, C.
Mirabelli, G.
Duffy, R.
Galdon, J.
Navarro, S.
Hurley, P.K.
Gamiz, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Improved Retention Characteristics of Z2-FET Employing Half Back-Gate Control

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(3):1041-1044 Mar, 2021
Author: Kwon, S.
Navarro, C.
Gamiz, F.
Galy, P.
Cristoloveanu, S.
Kim, Y.-.
Ahn, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS

Memory Operation of Z²-FET Without Selector at High Temperature

학술저널

issue: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 9:658-662 2021
Author: Kwon, S.
Navarro, C.
Gamiz, F.
Cristoloveanu, S.
Kim, Y.
Ahn, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS

Temperature and Gate Leakage Influence on the Z2-FET Memory Operation

회의자료

issue: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :238-241 Sep, 2019
Author: Marquez, C.
Navarro, S.
Navarro, C.
Salazar, N.
Galy, P.
Cristoloveanu, S.
Gamiz, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

TCAD Analysis of III-V capacitor-less A2RAM cells

회의자료

issue: 2019 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) Ultimate Integration on Silicon (EUROSOI-ULIS), 2019 Joint International EUROSOI Workshop and International Conference on. :1-4 Apr, 2019
Author: Navarro, Carlos
Navarro, Santiago
Marquez, Carlos
Gamiz, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Memory Operations of Zero Impact Ionization, Zero Subthreshold Swing FET Matrix Without Selectors

학술저널

issue: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(3):361-364 Mar, 2020
Author: Kwon, S.
Navarro, C.
Galy, P.
Cristoloveanu, S.
Gamiz, F.
Ahn, J.
Kim, Y.
DB Label: Database : IEEE Xplore Digital Library