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전체선택

Modeling of broadband noise in complementary (npn + pnp) SiGe HBTs

회의자료

issue: 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers Radio frequency integrated circuits Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE. :553-556 2005
Author: Banerjee, B.
Venkataraman, S.
Enhai Zhao
Chang-Ho Lee
Cressler, J.D.
Laskar, J.
El-Kareh, B.
Balster, S.
Yasuda, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A 5V complementary-SiGe BiCMOS technology for high-speed precision analog circuits

회의자료

issue: 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, 2003. Proceedings of the. :211-214 2003
Author: El-Kareh, B.
Balster, S.
Leitz, W.
Steinmann, P.
Yasuda, H.
Corsi, M.
Dawoodi, K.
Dirnecker, C.
Foglietti, P.
Haeusler, A.
Menz, P.
Ramin, M.
Scharnagl, T.
Schiekofer, M.
Schober, M.
Schulz, U.
Swanson, L.
Tatman, D.
Waitschull, M.
Weijtmans, J.W.
Willis, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A highly manufacturable 0.25/spl mu/m RF technology utilizing a unique SiGe integration

회의자료

issue: Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, Proceedings of the 2001. :56-59 2001
Author: Johnson, F.S.
Ai, J.
Dunn, S.
El Kareh, B.
Erdeljac, J.
John, S.
Benaissa, K.
Bellaour, A.
Benna, B.
Hodgson, L.
Hoffleisch, G.
Hutter, L.
Jaumann, M.
Jumpertz, R.
Mercer, M.
Nair, M.
Seitchik, J.
Shen, C.
Schiekofer, M.
Scharnagl, T.
Schimpf, K.
Schulz, U.
Staufer, B.
Stroth, L.
Tatman, D.
Thompson, M.
Williams, B.
Violette, K.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

The Effects of Proton and X-Ray Irradiation on the DC and AC Performance of Complementary (npn + pnp) SiGe HBTs on Thick-Film SOI

학술저널

issue: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 54(6):2245-2250 Dec, 2007
Author: Bellini, M.
Jun, B.
Sutton, A. K.
Appaswamy, A. C.
Cheng, P.
Cressler, J. D.
Marshall, P. W.
Schrimpf, R. D.
Fleetwood, D. M.
El-Kareh, B.
Balster, S.
Steinmann, P.
Yasuda, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Development of a high bandwidth merged logic/DRAM multimedia chip

회의자료

issue: Proceedings International Conference on Computer Design VLSI in Computers and Processors VLSI in computers and processors Computer Design: VLSI in Computers and Processors, 1997. ICCD '97. Proceedings., 1997 IEEE International Conference on. :279-285 1997
Author: Luk, W.K.
Katayama, Y.
Hwang, W.
Wordeman, M.
Kirihata, T.
Satoh, A.
Munetoh, S.
Wong, H.
El-Kareh, B.
Xiao, P.
Joshi, R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Device design methodology and reliability strategy for deep sub-micron technology [DRAMs]

회의자료

issue: 1997 IEEE International Integrated Reliability Workshop Final Report (Cat. No.97TH8319) Integrated reliability workshop Integrated Reliability Workshop Final Report, 1997 IEEE International. :147-152 1997
Author: Divakaruni, R.
El-Kareh, B.
Tonti, W.R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Ion implantation damage in quarter micron CMOS technology

회의자료

issue: Proceedings of 11th International Conference on Ion Implantation Technology Ion implantation technology Ion Implantation Technology. Proceedings of the 11th International Conference on. :49-52 1996
Author: Bala, K.
Hoepfner, J.
Tanimoto, H.
Takedai, S.
Sugiura, S.
El-Kareh, B.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

An investigation of low-frequency noise in complementary SiGe HBTs

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(2):329-338 Feb, 2006
Author: Enhai Zhao
Krithivasan, R.
Sutton, A.K.
Zhenrong Jin
Cressler, J.D.
El-Kareh, B.
Balster, S.
Yasuda, H.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR) 원문복사신청 - FRIC

Yield management in microelectronic manufacturing

회의자료

issue: 1995 Proceedings. 45th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1995. Proceedings., 45th. :58-63 1995
Author: El-Kareh, B.
Ghatalia, A.
Satya, A.V.S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Ion implantation issues in microelectronic device manufacturing

회의자료

issue: 1995 Proceedings. 45th Electronic Components and Technology Conference Electronic components and technology Electronic Components and Technology Conference, 1995. Proceedings., 45th. :51-57 1995
Author: Bala, K.
Hoepfner, J.
El-Kareh, B.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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