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전체선택

Emerging Vision Technology: SPI Camera an Overview

학술저널

issue: IEEE Instrumentation & Measurement Magazine IEEE Instrum. Meas. Mag. Instrumentation & Measurement Magazine, IEEE. 27(2):38-47 Apr, 2024
Author: Quero, Carlos Osorio
Durini, Daniel
de Jesus Rangel-Magdaleno, Jose
Martinez-Carranza, Jose
Ramos-Garcia, Ruben
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

2D NIR-SPI spatial resolution evaluation under scattering condition

회의자료

issue: 2022 19th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE) Electrical Engineering, Computing Science and Automatic Control (CCE), 2022 19th International Conference on. :1-6 Nov, 2022
Author: Quero, Carlos Alexander Osorio
Durini, Daniel
Rangel-Magdaleno, Jose de Jesus
Martinez-Carranza, Jose
Ramos-Garcia, Ruben
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Aztec curve: proposal for a new space-filling curve

보고서

issue: Proceedings of the 7th Brazilian Technology Symposium BTSym21, 2021
Author: Ayala, Diego
Durini, Daniel
Rangel-Magdaleno, Jose
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

Aztec Curve: Proposal for a New Space-Filling Curve

전자책

issue: Proceedings of the 7th Brazilian Technology Symposium (BTSym’21) : Emerging Trends in Human Smart and Sustainable Future of Cities (Volume 1). 207:403-411
Author: Ayala, Diego^Aff9
Durini, Daniel^Aff9
Rangel-Magdaleno, Jose^Aff9
DB Label: Database : Springer Nature eBooks

원문보기

Assessment of the photodetection performance of different silicon photomultiplier technologies under irradiation with cold neutrons

회의자료

issue: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), 2016. :1-4 Oct, 2016
Author: Durini, Daniel
Degenhardt, Carsten
Palomino-Razo, Alejandro
Kumar, Shashank
Feoktystov, Artem
Frielinghaus, Henrich
Rongen, Heinz
Schlosser, Mario
van Waasen, Stefan
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Development and Characterization of a Position Sensitive Neutron Scintillation Detector using Digital Silicon Photomultipliers

회의자료

issue: 2017 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2017 IEEE. :1-3 Oct, 2017
Author: Herzkamp, Matthias
Durini, Daniel
Degenhardt, Carsten
Erven, Andreas
Noldgen, Holger
Feoktystov, Artem
Jokhovets, Liubov
Streun, Matthias
van Waasen, Stefan
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Enhancing 3D human pose estimation with NIR single-pixel imaging and time-of-flight technology: a deep learning approach

학술저널

issue: JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION; MAR 1 2024, 41 3, p414-p423, 10p.
Author: Quero, Carlos Osorio
Durini, Daniel
Rangel-Magdaleno, Jose
Martinez-Carranza, Jose
Ramos-Garcia, Ruben
DB Label: Database : Science Citation Index Expanded

원문보기: Full Text (OSA) 등재 - Web of Science 등재 - SCOPUS 조회 - Impact Factor (JCR)

Speed considerations for LDPD based time-of-flight CMOS 3D image sensors

회의자료

issue: 2013 Proceedings of the ESSCIRC (ESSCIRC) ESSCIRC (ESSCIRC), 2013 Proceedings of the. :299-302 Sep, 2013
Author: Suss, Andreas
Nitta, Christian
Spickermann, Andreas
Durini, Daniel
Varga, Gabor
Jung, Melanie
Brockherde, Werner
Hosticka, Bedrich J.
Vogt, Holger
Schwope, Stefan
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Low-noise and large-area CMOS SPADs with timing response free from slow tails

회의자료

issue: 2012 Proceedings of the European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2012 Proceedings of the European. :230-233 Sep, 2012
Author: Bronzi, Danilo
Villa, Federica
Bellisai, Simone
Markovic, Bojan
Tisa, Simone
Tosi, Alberto
Zappa, Franco
Weyers, Sascha
Durini, Daniel
Brockherde, Werner
Paschen, Uwe
DB Label: Database : IEEE Xplore Digital Library