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1

회의자료

issue
2023 IEEE 28th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2023 IEEE 28th International Conference on. :1-8 Sep, 2023
Author
Desai, Nitin
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
2

회의자료

issue
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2022 IEEE 27th International Conference on. :1-4 Sep, 2022
Author
Desai, Nitin
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2020 IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS) Real-Time and Embedded Technology and Applications Symposium (RTAS), 2020 IEEE. :30-42 Apr, 2020
Author
Markovic, Filip
Carlson, Jan
Dobrin, Radu
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2018 IEEE 13th International Symposium on Industrial Embedded Systems (SIES) Industrial Embedded Systems (SIES), 2018 IEEE 13th International Symposium on. :1-10 Jun, 2018
Author
Markovic, Filip
Carlson, Jan
Dobrin, Radu
Lisper, Bjorn
Thekkilakattil, Abhilash
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2017 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) Emerging Technologies and Factory Automation (ETFA), 2017 22nd IEEE International Conference on. :1-8 Sep, 2017
Author
Gutierrez, Marina
Ademaj, Astrit
Steiner, Wilfried
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2017 IEEE Real-Time and Embedded Technology and Applications Symposium (RTAS) RTAS Real-Time and Embedded Technology and Applications Symposium (RTAS), 2017 IEEE. :273-282 Apr, 2017
Author
Gutierrez, Marina
Steiner, Wilfried
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

회의자료

issue
2015 IEEE Real-Time Systems Symposium Real-Time Systems Symposium, 2015 IEEE. :96-106 Dec, 2015
Author
Davis, Robert I.
Thekkilakattil, Abhilash
Gettings, Oliver
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

회의자료

issue
2015 IEEE International Workshop on Measurements & Networking (M&N) Measurements & Networking (M&N), 2015 IEEE International Workshop on. :1-6 Oct, 2015
Author
Gutierrez, Marina
Steiner, Wilfried
Dobrin, Radu
Punnekkat, Sasikumar
DB Label
Database : IEEE Xplore Digital Library
원문보기
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