전남대학교 중앙도서관

Counting Crowds in Bad Weather

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issue: 2023 IEEE/CVF International Conference on Computer Vision (ICCV) ICCV Computer Vision (ICCV), 2023 IEEE/CVF International Conference on. :23251-23262 Oct, 2023
Author: Huang, Zhi-Kai
Chen, Wei-Ting
Chiang, Yuan-Chun
Kuo, Sy-Yen
Yang, Ming-Hsuan
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 Image Shadow Removal Challenge Report

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1788-1807 Jun, 2023
Author: Vasluianu, Florin-Alexandru
Seizinger, Tim
Timofte, Radu
Cui, Shuhao
Huang, Junshi
Tian, Shuman
Fan, Mingyuan
Zhang, Jiaqi
Zhu, Li
Wei, Xiaoming
Wei, Xiaolin
Luo, Ziwei
Gustafsson, Fredrik K.
Zhao, Zheng
Sjolund, Jens
Schon, Thomas B.
Dong, Xiaoyi
Zhang, Xi Sheryl
Li, Chenghua
Leng, Cong
Yeo, Woon-Ha
Oh, Wang-Taek
Lee, Yeo-Reum
Ryu, Han-Cheol
Luo, Jinting
Jiang, Chengzhi
Han, Mingyan
Wu, Qi
Lin, Wenjie
Yu, Lei
Li, Xinpeng
Jiang, Ting
Fan, Haoqiang
Liu, Shuaicheng
Xu, Shuning
Song, Binbin
Chen, Xiangyu
Zhang, Shile
Zhou, Jiantao
Zhang, Zhao
Zhao, Suiyi
Zheng, Huan
Gao, Yangcheng
Wei, Yanyan
Wang, Bo
Ren, Jiahuan
Luo, Yan
Kondo, Yuki
Miyata, Riku
Yasue, Fuma
Naruki, Taito
Ukita, Norimichi
Chang, Hua-En
Yang, Hao-Hsiang
Chen, Yi-Chung
Chiang, Yuan-Chun
Huang, Zhi-Kai
Chen, Wei-Ting
Chen, I-Hsiang
Hsieh, Chia-Hsuan
Kuo, Sy-Yen
Xianwei, Li
Fu, Huiyuan
Liu, Chunlin
Ma, Huadong
Fu, Binglan
He, Huiming
Wang, Mengjia
She, Wenxuan
Liu, Yu
Nathan, Sabari
Kansal, Priya
Zhang, Zhongjian
Yang, Huabin
Wang, Yan
Zhang, Yanru
Phutke, Shruti S.
Kulkarni, Ashutosh
Khan, MD Raqib
Murala, Subrahmanyam
Vipparthi, Santosh Kumar
Ye, Heng
Liu, Zixi
Yang, Xingyi
Liu, Songhua
Wu, Yinwei
Jing, Yongcheng
Yu, Qianhao
Zheng, Naishan
Huang, Jie
Long, Yuhang
Yao, Mingde
Zhao, Feng
Zhao, Bowen
Ye, Nan
Shen, Ning
Cao, Yanpeng
Xiong, Tong
Xia, Weiran
Li, Dingwen
Xia, Shuchen
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 Challenge on 360° Omnidirectional Image and Video Super-Resolution: Datasets, Methods and Results

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1731-1745 Jun, 2023
Author: Cao, Mingdeng
Mou, Chong
Yu, Fanghua
Wang, Xintao
Zheng, Yinqiang
Zhang, Jian
Dong, Chao
Li, Gen
Shan, Ying
Timofte, Radu
Sun, Xiaopeng
Li, Weiqi
Zhang, Zhenyu
Sheng, Xuhan
Chen, Bin
Ma, Haoyu
Cheng, Ming
Zhao, Shijie
Cui, Wanwan
Xu, Tianyu
Li, Chunyang
Bao, Long
Sun, Heng
Huang, Huaibo
Zhou, Xiaoqiang
Ai, Yuang
He, Ran
Wu, Renlong
Yang, Yi
Zhang, Zhilu
Zhang, Shuohao
Li, Junyi
Chen, Yunjin
Ren, Dongwei
Zuo, Wangmeng
Wang, Qian
Yang, Hao-Hsiang
Chen, Yi-Chung
Huang, Zhi-Kai
Chen, Wei-Ting
Chiang, Yuan-Chun
Chang, Hua-En
Chen, I-Hsiang
Hsieh, Chia-Hsuan
Kuo, Sy-Yen
Zhang, Zebin
Zhang, Jiaqi
Wang, Yuhui
Cui, Shuhao
Huang, Junshi
Zhu, Li
Tian, Shuman
Yu, Wei
Luo, Bingchun
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

TSRFormer: Transformer Based Two-stage Refinement for Single Image Shadow Removal

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1436-1446 Jun, 2023
Author: Chang, Hua-En
Hsieh, Chia-Hsuan
Yang, Hao-Hsiang
Chen, I-Hsiang
Chen, Yi-Chung
Chiang, Yuan-Chun
Huang, Zhi-Kai
Chen, Wei-Ting
Kuo, Sy-Yen
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 Challenge on Night Photography Rendering

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1982-1993 Jun, 2023
Author: Shutova, Alina
Ershov, Egor
Perevozchikov, Georgy
Ermakov, Ivan
Banic, Nikola
Timofte, Radu
Collins, Richard
Efimova, Maria
Terekhin, Arseniy
Zini, Simone
Rota, Claudio
Buzzelli, Marco
Bianco, Simone
Schettini, Raimondo
Lei, Chunxia
Wang, Tingniao
Wang, Song
Liu, Shuai
Feng, Chaoyu
Shao, Guangqi
Wang, Hao
Wang, Xiaotao
Lei, Lei
Xu, Lu
Zhang, Chao
Wang, Yasi
Guo, Jin
Sun, Yangfan
Liu, Tianli
Hao, Dejun
Kinli, Furkan
Ozcan, Baris
Kirac, Furkan
Chung, Hyerin
Lee, Nakyung
Kwak, Sung Keun
Conde, Marcos
Seizinger, Tim
Vasluianu, Florin
Elezabi, Omar
Hsieh, Chia-Hsuan
Chen, Wei-Ting
Yang, Hao-Hsiang
Huang, Zhi-Kai
Chang, Hua-En
Chen, I-Hsiang
Chen, Yi-Chung
Chiang, Yuan-Chun
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 Challenge on Efficient Super-Resolution: Methods and Results

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1922-1960 Jun, 2023
Author: Li, Yawei
Zhang, Yulun
Timofte, Radu
Van Gool, Luc
Yu, Lei
Li, Youwei
Li, Xinpeng
Jiang, Ting
Wu, Qi
Han, Mingyan
Lin, Wenjie
Jiang, Chengzhi
Luo, Jinting
Fan, Haoqiang
Liu, Shuaicheng
Wang, Yucong
Cai, Minjie
Li, Mingxi
Zhang, Yuhang
Fan, Xian-Jun
Sheng, Yankai
Mao, Yanyu
Zhang, Nihao
Wang, Qian
Zheng, Mingjun
Sun, Long
Pan, Jinshan
Dong, Jiangxin
Tang, Jinhui
Yang, Zhongbao
Wang, Yan
Pan, Erlin
Cai, Qixuan
Dai, Xinan
Zhussip, Magauiya
Kalyazin, Nikolay
Vyal, Dmitry
Zou, Xueyi
Yan, Youliang
Chung, Heaseo
Zhang, Jin
Yu, Gaocheng
Zhang, Feng
Wang, Hongbin
Liao, Bohao
Du, Zhibo
Wu, Yu-Liang
Shi, Gege
Peng, Long
Wang, Yang
Cao, Yang
Zha, Zhengjun
Huang, Zhi-Kai
Chen, Yi-Chung
Chiang, Yuan-Chun
Yang, Hao-Hsiang
Chen, Wei-Ting
Chang, Hua-En
Chen, I-Hsiang
Hsieh, Chia-Hsuan
Kuo, Sy-Yen
Liu, Xin
Pan, Jiahao
Yu, Hongyuan
Yu, Weichen
Ge, Lin
Dong, Jiahua
Zou, Yajun
Wu, Zhuoyuan
Han, Binnan
Zhang, Xiaolin
Zhang, Heng
Yin, Xuanwu
Zuo, Kunlong
Deng, Weijian
Yuan, Hongjie
Lu, Zengtong
Ouyang, Mingyu
Ma, Wenzhuo
Liu, Nian
Zheng, Hanyou
Zhang, Yuantong
Zhang, Junxi
Chen, Zhenzhong
Gendy, Garas
Sabor, Nabil
Hou, Jingchao
He, Guanghui
Zhu, Yurui
Wang, Xi
Fu, Xueyang
Zha, Zheng-Jun
Yin, Daheng
Liu, Mengyang
Chen, Baijun
Li, Ao
Luo, Lei
Jin, Kangjun
Zhu, Ce
Zhang, Xiaoming
Xie, Chengxing
Li, Linze
Meng, Haiteng
Zhang, Tianlin
Li, Tianrui
Zhao, Xiaole
Zhang, Zhao
Li, Baiang
Zheng, Huan
Zhao, Suiyi
Gao, Yangcheng
Ren, Jiahuan
Hu, Kang
Shi, Jingpeng
Wu, Zhijian
Huang, Dingjiang
Zhu, Jinchen
Li, Hui
Xv, Qianru
Liu, Tianle
Weng, Shizhuang
Wu, Gang
Jiang, Junpeng
Liu, Xianming
Jiang, Junjun
Zhang, Mingjian
Hu, Jing
Wu, Chengxu
Fan, Qinrui
Feng, Chengming
Luo, Ziwei
Hu, Shu
Lyu, Siwei
Wu, Xi
Wang, Xin
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 HR NonHomogeneous Dehazing Challenge Report

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1808-1825 Jun, 2023
Author: Ancuti, Codruta O.
Ancuti, Cosmin
Vasluianu, Florin-Alexandru
Timofte, Radu
Zhou, Han
Dong, Wei
Liu, Yangyi
Chen, Jun
Liu, Huan
Li, Liangyan
Wu, Zijun
Dong, Yubo
Li, Yuyan
Qiu, Tian
He, Yu
Lu, Yonghong
Wu, Yinwei
Jiang, Zhenxiang
Liu, Songhua
Yang, Xingyi
Jing, Yongcheng
Benjdira, Bilel
Ali, Anas M.
Koubaa, Anis
Yang, Hao-Hsiang
Chen, I-Hsiang
Chen, Wei-Ting
Huang, Zhi-Kai
Chen, Yi-Chung
Hsieh, Chia-Hsuan
Chang, Hua-En
Chiang, Yuan-Chun
Kuo, Sy-Yen
Guo, Yu
Gao, Yuan
Liu, Ryan Wen
Lu, Yuxu
Qu, Jingxiang
He, Shengfeng
Ren, Wenqi
Hoang, Trung
Zhang, Haichuan
Yazdani, Amirsaeed
Monga, Vishal
Yang, Lehan
Wu, Alex Jiahao
Mai, Tiancheng
Cong, Xiaofeng
Yin, Xuemeng
Yin, Xuefei
Emad, Hazim
Abdallah, Ahmed
Yasser, Yahya
Elshahat, Dalia
Elbaz, Esraa
Li, Zhan
Kuang, Wenqing
Luo, Ziwei
Gustafsson, Fredrik K.
Zhao, Zheng
Sjolund, Jens
Schon, Thomas B.
Zhang, Zhao
Wei, Yanyan
Wang, Junhu
Zhao, Suiyi
Zheng, Huan
Guo, Jin
Sun, Yangfan
Liu, Tianli
Hao, Dejun
Jiang, Kui
Sarvaiya, Anjali
Prajapati, Kalpesh
Patra, Ratnadeep
Barik, Pragnesh
Rathod, Chaitanya
Upla, Kishor
Raja, Kiran
Ramachandra, Raghavendra
Busch, Christoph
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Efficient Deep Models for Real-Time 4K Image Super-Resolution. NTIRE 2023 Benchmark and Report

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1495-1521 Jun, 2023
Author: Conde, Marcos V.
Zamfir, Eduard
Timofte, Radu
Motilla, Daniel
Liu, Cen
Zhang, Zexin
Peng, Yunbo
Lin, Yue
Guo, Jiaming
Zou, Xueyi
Chen, Yuyi
Liu, Yi
Hao, Jia
Yan, Youliang
Zhang, Yuanfan
Li, Gen
Sun, Lei
Kong, Lingshun
Bai, Haoran
Pan, Jinshan
Dong, Jiangxin
Tang, Jinhui
Ayazoglu, Mustafa
Bilecen, Bahri Batuhan
Li, Mingxi
Zhang, Yuhang
Fan, Xianjun
Sheng, Yankai
Sun, Long
Liu, Zibin
Gou, Weiran
Li, Shaoqing
Yi, Ziyao
Xiang, Yan
Kong, Dehui
Xu, Ke
Gankhuyag, Ganzorig
Yoon, Kihwan
Zhang, Jin
Yu, Gaocheng
Zhang, Feng
Wang, Hongbin
Zhou, Zhou
Chao, Jiahao
Gao, Hongfan
Gong, Jiali
Yang, Zhengfeng
Zeng, Zhenbing
Chen, Chengpeng
Guo, Zichao
Park, Anjin
Liu, Yuqing
Jia, Qi
Yu, Hongyuan
Yin, Xuanwu
Zuo, Kunlong
Zhang, Dongyang
Fu, Ting
Cheng, Zhengxue
Zhu, Shiai
Zhou, Dajiang
Yu, Weichen
Ge, Lin
Dong, Jiahua
Zou, Yajun
Wu, Zhuoyuan
Han, Binnan
Zhang, Xiaolin
Zhang, Heng
Shao, Ben
Zheng, Shaolong
Yin, Daheng
Chen, Baijun
Liu, Mengyang
Nistor, Marian-Sergiu
Chen, Yi-Chung
Huang, Zhi-Kai
Chiang, Yuan-Chun
Chen, Wei-Ting
Yang, Hao-Hsiang
Chang, Hua-En
Chen, I-Hsiang
Hsieh, Chia-Hsuan
Kuo, Sy-Yen
Vo, Tu
Yan, Qingsen
Zhu, Yun
Su, Jinqiu
Zhang, Yanning
Zhang, Cheng
Luo, Jiaying
Cho, Youngsun
Lee, Nakyung
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

NTIRE 2023 Challenge on Stereo Image Super-Resolution: Methods and Results

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1346-1372 Jun, 2023
Author: Wang, Longguang
Guo, Yulan
Wang, Yingqian
Li, Juncheng
Gu, Shuhang
Timofte, Radu
Cheng, Ming
Ma, Haoyu
Ma, Qiufang
Sun, Xiaopeng
Zhao, Shijie
Sheng, Xuhan
Ding, Yukan
Sun, Ming
Wen, Xing
Zhang, Dafeng
Li, Jia
Wang, Fan
Xie, Zheng
He, Zongyao
Qiu, Zidian
Pan, Zilin
Zhan, Zhihao
Xian, Xingyuan
Jin, Zhi
Zhou, Yuanbo
Deng, Wei
Nie, Ruofeng
Zhang, Jiajun
Gao, Qinquan
Tong, Tong
Zhang, Kexin
Zhang, Junpei
Peng, Rui
Ma, Yanbiao
Jiao, Licheng
Bai, Haoran
Kong, Lingshun
Pan, Jinshan
Dong, Jiangxin
Tang, Jinhui
Cao, Pu
Huang, Tianrui
Yang, Lu
Song, Qing
Chen, Bingxin
He, Chunhua
Chen, Meiyun
Guo, Zijie
Luo, Shaojuan
Cao, Chengzhi
Wang, Kunyu
Zhang, Fanrui
Zhang, Qiang
Mehta, Nancy
Murala, Subrahmanyam
Dudhane, Akshay
Wang, Yujin
Li, Lingen
Gendy, Garas
Sabor, Nabil
Hou, Jingchao
He, Guanghui
Chen, Junyang
Li, Hao
Shi, Yukai
Yang, Zhijing
Zou, Wenbin
Zhang, Yunchen
Jiang, Mingchao
Yu, Zhongxin
Tan, Ming
Gao, Hongxia
Luo, Ziwei
Gustafsson, Fredrik K.
Zhao, Zheng
Sjolund, Jens
Schon, Thomas B.
Chen, Jingxiang
Yang, Bo
Zhang, XiSheryl
Li, Chenghua
Yuan, Weijun
Li, Zhan
Deng, Ruting
Zeng, Jintao
Mahajan, Pulkit
Mistry, Sahaj
Chatterjee, Shreyas
Jakhetiya, Vinit
Subudhi, Badri
Jaiswal, Sunil
Zhang, Zhao
Zheng, Huan
Zhao, Suiyi
Gao, Yangcheng
Wei, Yanyan
Wang, Bo
Li, Gen
Li, Aijin
Sun, Lei
Chen, Ke
Tang, Congling
Li, Yunzhe
Chen, Jun
Chiang, Yuan-Chun
Chen, Yi-Chung
Huang, Zhi-Kai
Yang, Hao-Hsiang
Chen, I-Hsiang
Kuo, Sy-Yen
Wang, Yiheng
Zhu, Gang
Yang, Xingyi
Liu, Songhua
Jing, Yongcheng
Hu, Xingyu
Song, Jianwen
Sun, Changming
Sowmya, Arcot
Park, Seung Ho
Lei, Xiaoyan
Wang, Jingchao
Zhai, Chenbo
Zhang, Yufei
Cao, Weifeng
Zhang, Wenlong
DB Label: Database : IEEE Xplore Digital Library

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Semantic Guidance Learning for High-Resolution Non-homogeneous Dehazing

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issue: 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) CVPRW Computer Vision and Pattern Recognition Workshops (CVPRW), 2023 IEEE/CVF Conference on. :1447-1455 Jun, 2023
Author: Yang, Hao-Hsiang
Chen, I-Hsiang
Hsieh, Chia-Hsuan
Chang, Hua-En
Chiang, Yuan-Chun
Chen, Yi-Chung
Huang, Zhi-Kai
Chen, Wei-Ting
Kuo, Sy-Yen
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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