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1

회의자료

issue
2018 24th International Conference on Pattern Recognition (ICPR) Pattern Recognition (ICPR), 2018 24th International Conference on. :3457-3462 Aug, 2018
Author
Guo, Bingchen H.
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
2018 IEEE 4th International Conference on Identity, Security, and Behavior Analysis (ISBA) Identity, Security, and Behavior Analysis (ISBA), 2018 IEEE 4th International Conference on. :1-8 Jan, 2018
Author
Guo, Bingchen H.
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
2016 23rd International Conference on Pattern Recognition (ICPR) Pattern Recognition (ICPR), 2016 23rd International Conference on. :1756-1761 Dec, 2016
Author
Abuzaina, Anas
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
2016 23rd International Conference on Pattern Recognition (ICPR) Pattern Recognition (ICPR), 2016 23rd International Conference on. :3067-3072 Dec, 2016
Author
Martinho-Corbishley, Daniel
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
2016 IEEE 8th International Conference on Biometrics Theory, Applications and Systems (BTAS) Biometrics Theory, Applications and Systems (BTAS), 2016 IEEE 8th International Conference on. :1-6 Sep, 2016
Author
Martinho-Corbishley, Daniel
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
2016 IEEE International Conference on Identity, Security and Behavior Analysis (ISBA) Identity, Security and Behavior Analysis (ISBA), 2016 IEEE International Conference on. :1-6 Feb, 2016
Author
Martinho-Corbishley, Daniel
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2014 22nd International Conference on Pattern Recognition Pattern Recognition (ICPR), 2014 22nd International Conference on. :2125-2130 Aug, 2014
Author
Abuzaina, Anas
Nixon, Mark S.
Carter, John N.
DB Label
Database : IEEE Xplore Digital Library
원문보기
9

학술저널

issue
45 San Diego L. Rev. 383 (2008) / San Diego Law Review, Vol. 45, Issue 2 (May-June 2008), pp. 383-440
Author
Ursin, Edmund
Carter, John N.
DB Label
Database : HeinOnline
원문보기
10

회의자료

issue
2013 IEEE Sixth International Conference on Biometrics: Theory, Applications and Systems (BTAS) Biometrics: Theory, Applications and Systems (BTAS), 2013 IEEE Sixth International Conference on. :1-6 Sep, 2013
Author
Bustard, John D.
Carter, John N.
Nixon, Mark S.
DB Label
Database : IEEE Xplore Digital Library
원문보기
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