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전체선택

Analytical Model of SRAM VMin to Predict Reliability and Process Impact

회의자료

issue: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-4 Oct, 2023
Author: Kumar, Tanuj
Cacho, Florian
Roy, Tanmoy
De La Bardonnie, Marc
Pelle, Servan
Giner, Fabien
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Current Driven Modeling and SILC Investigation of Oxide Breakdown under Off-state TDDB in 28nm dedicated to RF applications

회의자료

issue: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-6 Oct, 2023
Author: Garba-Seybou, Tidjani
Bravaix, Alain
Federspiel, Xavier
Hai, Joycelyn
Diouf, Cheikh
Cacho, Florian
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications

회의자료

issue: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-8 Mar, 2023
Author: Garba-Seybou, Tidjani
Federspiel, Xavier
Monsieur, Frederic
Sicre, Mathieu
Cacho, Florian
Hai, Joycelyn
Bravaix, Alain
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Investigating Reliability of NIR QD-based Photodiodes Under Bias and Light Stres

회의자료

issue: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-4 Oct, 2022
Author: Hammad, Ismail
Coignus, Jean
Ney, David
Doyen, Celestin
Perrin, Sebastien
Ricq, Stephane
Cacho, Florian
Wantz, Guillaume
Federspiel, Xavier
Roy, David
Josse, Emmanuel
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

40nm Ultra-low Leakage SRAM with Embedded Sub-threshold Analog Closed Loop System for Efficient Source Biasing of the Memory Array in Retention Mode

회의자료

issue: 2022 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID) VLSID VLSI Design and 2022 21st International Conference on Embedded Systems (VLSID), 2022 35th International Conference on. :216-221 Feb, 2022
Author: Dhori, Kedar Janardan
Kumar, Promod
Lecocq, Christophe
Urard, Pascal
Callen, Olivier
Cacho, Florian
Parra, Maryline
Pandey, Prashant
Noblet, Daniel
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Hot-Carrier induced Breakdown events from Off to On mode in NEDMOS

회의자료

issue: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-8 Apr, 2020
Author: Bravaix, Alain
Kussener, Edith
Ney, David
Federspiel, Xavier
Cacho, Florian
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Global and Local Process Variation Simulations in Design for Reliability approach

회의자료

issue: 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS ), 2019 IEEE 25th International Symposium on. :72-75 Jul, 2019
Author: MICHARD, Audrey
CACHO, Florian
CELESTE, Damien
FEDERSPIEL, Xavier
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

New Modelling Off-state TDDB for 130nm to 28nm CMOS nodes

회의자료

issue: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :11A.3-1-11A.3-7 Mar, 2022
Author: Garba-Seybou, Tidjani
Federspiel, Xavier
Bravaix, Alain
Cacho, Florian
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

FDSOI Mosfet gate dielectric breakdown Vd dependancy

회의자료

issue: 2018 International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2018 International. :1-4 Oct, 2018
Author: Federspiel, Xavier
Rafik, Mustapha
Arabi, Melissa
Cros, Antoine
Cacho, Florian
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

High-yield design of high-density SRAM for low-voltage and low-leakage operations

회의자료

issue: 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2017 IEEE International Symposium on. :1-6 Oct, 2017
Author: Dhori, Kedar Janardan
Chawla, Hitesh
Kumar, Ashish
Pandey, Prashant
Kumar, Promod
Ciampolini, Lorenzo
Cacho, Florian
Croain, Damien
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

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