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Simulation in action: the application of modelling to SPAD architecture design

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Pellegrini, S.
Nicholson, I.
Helleboid, R.
Mamdy, B.
Forcolin, G.
Al-Rawhani, M.
Buj, C.
Marchand, G.
Rae, B.
Golanski, D.
Mugny, G.
Bianchi, R. A.
Rideau, D.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Direct Measurements and Modeling of Avalanche Dynamics and Quenching in SPADs

회의자료

issue: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :144-147 Sep, 2023
Author: Rideau, D.
Uhring, W.
Bianchi, R. A.
Helleboid, R.
Mugny, G.
Grebot, J.
Manouvrier, J.R.
Neri, R.
Brun, F.
Lakeh, M. Dolatpoor
Rink, S.
Kammerer, J-B.
Lallement, C.
Lacombe, E.
Golanski, D.
Rae, B.
Bah, T. M.
Twaddle, F.
Quenette, V.
Marchand, G.
Buj, C.
Fillon, R.
Henrion, Y.
Nicholson, I.
Agnew, M.
Basset, M.
Perrier, R.
Al-Rawhani, M.
Mamdy, B.
Pellegrin, S.
Gouget, G.
Maciazek, P.
Juge, A.
Dartigues, A.
Alause, H. Wehbe
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Comprehensive Modeling and Characterization of Photon Detection Efficiency and Jitter Tail in Advanced SPAD Devices

학술저널

issue: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:584-592 2022
Author: Helleboid, R.
Rideau, D.
Grebot, J.
Nicholson, I.
Moussy, N.
Saxod, O.
Basset, M.
Zimmer, A.
Mamdy, B.
Golanski, D.
Agnew, M.
Pellegrini, S.
Sicre, M.
Buj, C.
Marchand, G.
Saint-Martin, J.
Pala, M.
Dollfus, P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Verilog-A model for avalanche dynamics and quenching in Single-Photon Avalanche Diodes

회의자료

issue: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :145-148 Sep, 2020
Author: oussaiti, Y.
Rideau, D.
Manouvrier, J.R.
Quenette, V.
Mamdy, B.
Buj, C.
Grebot, J.
Wehbe-Alause, H.
Lopez, A.
Mugny, G.
Agnew, M.
Lacombe, E.
Pala, M.
Dollfus, P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

600V bipolar power devices on thick SOI

회의자료

issue: 31st European Solid-State Device Research Conference Solid-State Device Research Conference, 2001. Proceeding of the 31st European. :395-398 2001
Author: Clavelier, L.
Dartigues, A.
Buj, C.
Charlet, B.
Gidon, P.
Giffard, B.
Gimonet, S.
Roy, M.
Schaeffer, C.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

FDSOI devices with thin BOX and ground plane integration for 32nm node and below

회의자료

issue: ESSDERC 2008 - 38th European Solid-State Device Research Conference Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European. :206-209 Sep, 2008
Author: Fenouillet-Beranger, C.
Denorme, S.
Perreau, P.
Buj, C.
Faynot, O.
Andrieu, F.
Tosti, L.
Barnola, S.
Salvetat, T.
Garros, X.
Casse, M.
Allain, F.
Loubet, N.
Pham-NGuyen, L.
Deloffre, E.
Gros-Jean, M.
Beneyton, R.
Laviron, C.
Marin, M.
Leyris, C.
Haendler, S.
Leverd, F.
Gouraud, P.
Scheiblin, P.
Clement, L.
Pantel, R.
Deleonibus, S.
Skotnicki, T.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Threshold voltage in ultra thin FDSOI CMOS : Advanced triple interface model and experimental devices

회의자료

issue: 2008 9th International Conference on Ultimate Integration of Silicon Ultimate Integration of Silicon, 2008. ULIS 2008. 9th International Conference on. :31-34 Mar, 2008
Author: Mazellier, J.P.
Andrieu, F.
Faynot, O.
Brevard, L.
Buj, C.
Cristoloveanu, S.
Le Tiec, Y.
Deleonibus, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

HF Characterisation of sub-100nm UTB-FDSOI with TiN/HfO2 Gate stack

회의자료

issue: 2008 9th International Conference on Ultimate Integration of Silicon Ultimate Integration of Silicon, 2008. ULIS 2008. 9th International Conference on. :145-148 Mar, 2008
Author: Lim, T. C.
Rozeau, O.
Buj, C.
Paccaud, M.
Dambrine, G.
Danneville, F.
DB Label: Database : IEEE Xplore Digital Library