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1

학술저널

issue
IEEE Transactions on Dependable and Secure Computing IEEE Trans. Dependable and Secure Comput. Dependable and Secure Computing, IEEE Transactions on. 21(2):701-716 Apr, 2024
Author
Khan, S.
Katoen, J.
Bouissou, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
2

회의자료

issue
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) Reliability and maintainability Reliability and Maintainability Symposium, 2002. Proceedings. Annual. :32-39 2002
Author
Bouissou, M.
Lefebvre, Y.
DB Label
Database : IEEE Xplore Digital Library
원문보기
3

회의자료

issue
Annual Reliability and Maintainability. Symposium. 1999 Proceedings (Cat. No.99CH36283) Reliability and maintainability Reliability and Maintainability Symposium, 1999. Proceedings. Annual. :142-150 1999
Author
Bouissou, M.
Martin, F.
Ourghanlian, A.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4

회의자료

issue
Annual Reliability and Maintainability Symposium Reliability and maintainability Reliability and Maintainability Symposium. 1997 Proceedings, Annual. :91-99 1997
Author
Bouissou, M.
Bourgade, E.
DB Label
Database : IEEE Xplore Digital Library
원문보기
5

회의자료

issue
Proceedings of 1996 Annual Reliability and Maintainability Symposium Reliability and maintainability Reliability and Maintainability Symposium, 1996 Proceedings. International Symposium on Product Quality and Integrity., Annual. :208-214 1996
Author
Bouissou, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
6

회의자료

issue
Proceedings of Annual Reliability and Maintainability Symposium (RAMS) Reliability and maintainability Reliability and Maintainability Symposium, 1994. Proceedings., Annual. :118-123 1994
Author
Madre, J.C.
Coudert, O.
Fraisse, H.
Bouissou, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
7

회의자료

issue
FTCS-23 The Twenty-Third International Symposium on Fault-Tolerant Computing Fault-tolerant computing Fault-Tolerant Computing, 1993. FTCS-23. Digest of Papers., The Twenty-Third International Symposium on. :680-685 1993
Author
Bouissou, M.
DB Label
Database : IEEE Xplore Digital Library
원문보기
8

회의자료

issue
2006 International Conference on Probabilistic Methods Applied to Power Systems Probabilistic Methods Applied to Power Systems, 2006. PMAPS 2006. International Conference on. :1-7 Jun, 2006
Author
Breton, E.
Bouissou, M.
Aupied, J.
DB Label
Database : IEEE Xplore Digital Library
원문보기
10

학술저널

issue
In Reliability Engineering and System Safety February 2013 110:110-126
Author
Piètre-Cambacédès, L.
Bouissou, M.
DB Label
Database : ScienceDirect
원문보기
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