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1
Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications 미리보기

회의자료

issue
2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-5 Mar, 2023
Author
Lipp, D.
Zhao, Z.
Krause, G.
Arfaoui, W.
Ebrard, E.
Bossu, G.
Evseev, S.
Herklotz, M.
Siddabathula, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
2
A 28 GHz 22FDX® PA with 31.5 % Peak PAE and Output Power of 21 dBm in CW, 18.5 dBm in QPSK, and 12.5 dBm in 64QAM 미리보기

회의자료

issue
2022 52nd European Microwave Conference (EuMC) Microwave Conference (EuMC), 2022 52nd European. :349-352 Sep, 2022
Author
Al-Husseini, Z.
Syed, S.
Testa, P. V.
Katzman, G.
Bossu, G.
Zhao, Z.
Moss, S.
Tianbing, C.
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Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
3
Implication of Self-Heating Effect on Device Reliability Characterization of Multi-Finger n-MOSFETs on 22FDSOI 미리보기

학술저널

issue
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(3):387-395 Sep, 2022
Author
Chohan, T.
Zhao, Z.
Lehmann, S.
Arfaoui, W.
Bossu, G.
Trommer, J.
Slesazeck, S.
Mikolajick, T.
Siddabathula, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE)  등재 - Web of Science (SCIE)  등재 - SCOPUS  조회 - Impact Factor (JCR) 
4
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area 미리보기

회의자료

issue
2021 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2021 IEEE International. :1-6 Mar, 2021
Author
Toledano-Luque, M.
Paliwoda, P.
Nour, M.
Kauerauf, T.
Min, B.
Bossu, G.
Siddabathula, M.
Nigam, T.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
5
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology 미리보기

회의자료

issue
2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020
Author
Arfaoui, W.
Bossu, G.
Muhlhoff, A.
Lipp, D.
Manuwald, R.
Chen, T.
Nigam, T.
Siddabathula, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
6
Excellent 22FDX Hot-Carrier Reliability for PA Applications 미리보기

회의자료

issue
2019 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2019 IEEE. :27-30 Jun, 2019
Author
Chen, T.
Zhang, C.
Arfaoui, W.
Bellaouar, A.
Embabi, S.
Bossu, G.
Siddabathula, M.
Chew, K.W.J.
Ong, S. N.
Mantravadi, M.
Barnett, K.
Bordelon, J.
Taylor, R.
Janardhanan, S.
DB Label
Database : IEEE Xplore Digital Library
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7
22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability 미리보기

회의자료

issue
2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :4B.4-1-4B.4-5 Mar, 2022
Author
Bossu, G.
Syed, S.
Evseev, S.
Jerome, J.A.S.
Arfaoui, W.
Lipp, D.
Siddabathula, M.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
8
Embedding formally proved code in a smart card: converting B to C 미리보기

회의자료

issue
ICFEM 2000. Third IEEE International Conference on Formal Engineering Methods Formal engineering methods Formal Engineering Methods, 2000. ICFEM 2000. Third IEEE International Conference on. :15-22 2000
Author
Requet, A.
Bossu, G.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
10
Low cost and high performance p-doped triple-gate access transistor for embedded DRAM memory cell 미리보기

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issue
2009 Proceedings of the European Solid State Device Research Conference Solid State Device Research Conference, 2009. ESSDERC '09. Proceedings of the European. :109-112 Sep, 2009
Author
Berthollet, F.
Cremer, S.
Bossu, G.
Carrere, J.P.
Jeanjean, D.
Pinzelli, L.
Pantel, R.
Lalanne, F.
Plossu, C.
Poncet, A.
DB Label
Database : IEEE Xplore Digital Library
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Full Text (IEEE) 
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