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1
A new approach to characterize substrate losses of on-chip inductors 미리보기

회의자료

issue
ICMTS 2001. Proceedings of the 2001 International Conference on Microelectronic Test Structures (Cat. No.01CH37153) Microelectronic test structures Microelectronic Test Structures, 2001. ICMTS 2001. Proceedings of the 2001 International Conference on. :115-118 2001
Author
Schimpf, L.
Benna, B.
Proetel, D.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
2
A highly manufacturable 0.25/spl mu/m RF technology utilizing a unique SiGe integration 미리보기

회의자료

issue
Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting (Cat. No.01CH37212) Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology Meeting, Proceedings of the 2001. :56-59 2001
Author
Johnson, F.S.
Ai, J.
Dunn, S.
El Kareh, B.
Erdeljac, J.
John, S.
Benaissa, K.
Bellaour, A.
Benna, B.
Hodgson, L.
Hoffleisch, G.
Hutter, L.
Jaumann, M.
Jumpertz, R.
Mercer, M.
Nair, M.
Seitchik, J.
Shen, C.
Schiekofer, M.
Scharnagl, T.
Schimpf, K.
Schulz, U.
Staufer, B.
Stroth, L.
Tatman, D.
Thompson, M.
Williams, B.
Violette, K.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
3
Conduction mechanisms of polysilicon emitters with thin interfacial oxide layers 미리보기

회의자료

issue
1984 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1984 International. :738-741 1984
Author
Schaber, H.
Benna, B.
Treitinger, L.
Wieder, A.W.
DB Label
Database : IEEE Xplore Digital Library
원문보기
4
Base current analysis of poly-Si emitter bipolar transistors 미리보기

회의자료

issue
1985 International Electron Devices Meeting IEDM Tech. Dig. Electron Devices Meeting, 1985 International. :302-305 1985
Author
Benna, B.
Meister, T.
Schaber, H.
Wieder, A.W.
DB Label
Database : IEEE Xplore Digital Library
원문보기
5
Vertical Scaling Considerations for Polysilicon-Emitter Bipolar Transistors 미리보기

회의자료

issue
ESSDERC '87: 17th European Solid State Device Research Conference Solid State Device Research Conference, 1987. ESSDERC '87. 17th European. :365-368 Sep, 1987
Author
Schaber, H.
Bieger, J.
Benna, B.
Meister, T.
DB Label
Database : IEEE Xplore Digital Library
원문보기
Full Text (IEEE) 
6
Vertical Scaling Considerations for Polysilicon-Emitter Bipolar Transistors 미리보기

전자책

issue
Ultra-Fast Silicon Bipolar Technology. 27:43-59
Author
Meister, T. F.Aff6
Schaber, H.Aff6
Ehinger, K.Aff6
Bieger, J.Aff6
Benna, B.Aff6
Maier, I.Aff6
DB Label
Database : Springer Nature eBooks
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10
Mitochondria in Alzheimer's Disease Pathogenesis. 미리보기

학술저널

issue
Life (Basel, Switzerland) [Life (Basel)] 2024 Jan 30; Vol. 14 (2). Date of Electronic Publication: 2024 Jan 30.
Author
Reiss AB; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Gulkarov S; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Jacob B; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Srivastava A; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Pinkhasov A; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Gomolin IH; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
Stecker MM; The Fresno Institute of Neuroscience, Fresno, CA 93730, USA.
Wisniewski T; Center for Cognitive Neurology, Departments of Neurology, Pathology and Psychiatry, New York University Grossman School of Medicine, New York, NY 10016, USA.
De Leon J; Department of Medicine and Biomedical Research Institute, NYU Grossman Long Island School of Medicine, Mineola, NY 11501, USA.
DB Label
Database : MEDLINE
원문보기
Full Text Full Text (원문보기) PLinkFull Text (원문보기) Open Access (PubMed Central)  조회 - Impact Factor (JCR)  등재 - Web of Science (SCIE)  등재 - SCOPUS 
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