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1. Traité contentant une nouvelle methode pour s'assurer des longitudes de tous les lieux de la terre, par le moyen des planettes & des etoiles par G. Bardon ...

전문(Full Text) 제공 DB / 패키지 :

Early English Books Online (EEBO) ProQuest 1700)

펼치기 닫기

Cradle-to-gate Life Cycle Assessment of CMOS Logic Technologies

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Boakes, L.
Garcia Bardon, M.
Schellekens, V.
Liu, I-Y.
Vanhouche, B.
Mirabelli, G.
Sebaai, F.
Van Winckel, L.
Gallagher, E.
Rolin, C.
Ragnarsson, L.-A.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Backside Power Delivery: Game Changer and Key Enabler of Advanced Logic Scaling and New STCO Opportunities

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Veloso, A.
Vermeersch, B.
Chen, R.
Matagne, P.
Bardon, M. Garcia
Eneman, G.
Serbulova, K.
Zografos, O.
Chen, S. H.
Sisto, G.
Jourdain, A.
Arimura, H.
O'Sullivan, B.
De Keersgieter, A.
Hellings, G.
Beyne, E.
Horiguchi, N.
Ryckaert, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Ultimate MRAM Scaling: Design Exploration of High-Density, High-Performance and Energy-Efficient VGSOT for Last Level Cache

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Gupta, M.
Xiangt, Y.
Garcia-Redondo, F.
Cai, K.
Abdi, D.
Liu, H.-H.
Rao, S.
Hiblot, G.
Couet, S.
Garcia-Bardon, M.
Hellings, G.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

3D Stacked Devices and MOL Innovations for Post-Nanosheet CMOS Scaling

회의자료

issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Horiguchi, N.
Mertens, H.
Chiarella, T.
Demuynck, S.
Vega-Gonzalez, V.
Vandooren, A.
Veloso, A.
Bardon, M. Garcia
Sisto, G.
Gupta, A.
Tokei, Z.
Biesemans, S.
Ryckaert, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

A Brief History of the Philosophy of Time

전자책

Author: Bardon, Adrian, author
DB Label: Database : Oxford Scholarship Online

원문보기

STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes

회의자료

issue: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :97-100 Sep, 2023
Author: Garcia-Redondo, F.
Rao, S.
Gupta, M.
Perumkunnil, M.
Xiang, Y.
Abdi, D.
Van Beek, S.
Couet, S.
Garcia-Bardon, M.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

CFET SRAM With Double-Sided Interconnect Design and DTCO Benchmark

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(10):5099-5106 Oct, 2023
Author: Liu, H.
Schuddinck, P.
Pei, Z.
Verschueren, L.
Mertens, H.
Salahuddin, S.M.
Hiblot, G.
Xiang, Y.
Chan, B.T.
Subramanian, S.
Weckx, P.
Hellings, G.
Bardon, M.G.
Ryckaert, J.
Pan, C.
Catthoor, F.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

Helical coil design with controlled dispersion for bunching enhancement of the TNSA protons

보고서

Author: Hirsch-Passicos, A
Lacoste, C L C
André, F
Elskens, Y
d'Humières, E
Tikhonchuk, V
Bardon, M
DB Label: Database : arXiv

원문보기: Open Access (Arxiv)

When Parents of Children with Severe Autism Become Their Teachers: Unique Cases from the COVID-19 Pandemic

학술저널

issue: Journal of the American Academy of Special Education Professionals. 2024:103-116.
Author: Sydney Bueno
Uzeyir Ogurlu
Lisa Bardon
Nikki Logan
DB Label: Database : ERIC

원문보기

Variability in Planar FeFETs—Channel Percolation Impact

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3928-3934 Jul, 2023
Author: Kaczmarek, K.
Bardon, M.G.
Xiang, Y.
Ronchi, N.
Ragnarsson, L.
Celano, U.
Banerjee, K.
Kaczer, B.
Groeseneken, G.
Van Houdt, J.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 등재 - Web of Science (SCIE) 등재 - SCOPUS 조회 - Impact Factor (JCR)

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