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전체선택

Shot Noise Suppression in Single Electron Transistors

학술저널

issue: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 11(6):1267-1272 Nov, 2012
Author: Babiker, S. F.
Naeem, R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS 원문복사신청 - FRIC

Shot Noise in Single-Electron Tunneling Systems: A Semiclassical Model

학술저널

issue: IEEE Transactions on Nanotechnology IEEE Trans. Nanotechnology Nanotechnology, IEEE Transactions on. 10(5):1191-1195 Sep, 2011
Author: Babiker, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS 원문복사신청 - FRIC

Strain engineered In/sub x/Ga/sub 1-x/As channel pHEMTs on virtual substrates: a simulation study

회의자료

issue: 1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116) Computational electronics Computational Electronics, 1998. IWCE-6. Extended Abstracts of 1998 Sixth International Workshop on. :178-181 1998
Author: Babiker, S.
Asenov, A.
Roy, S.
Barker, J.R.
Beaumont, S.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Monte Carlo investigation of optimal device architectures for SiGe FETs

회의자료

issue: 1998 Sixth International Workshop on Computational Electronics. Extended Abstracts (Cat. No.98EX116) Computational electronics Computational Electronics, 1998. IWCE-6. Extended Abstracts of 1998 Sixth International Workshop on. :210-213 1998
Author: Roy, S.
Kaya, S.
Babiker, S.
Asenov, A.
Barker, J.R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

RF performance of strained Si MODFETs and MOSFETs on "virtual" SiGe substrates: A Monte Carlo study

회의자료

issue: 27th European Solid-State Device Research Conference Solid-State Device Research Conference, 1997. Proceeding of the 27th European. :192-195 1997
Author: Roy, S.
Asenov, A.
Babiker, S.
Barker, J.R.
Beaumont, S.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Simulation of single-electron transport in nanostructured quantum dots

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 52(3):392-396 Mar, 2005
Author: Babiker, S.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS 원문복사신청 - FRIC

Complete Monte Carlo RF analysis of "real" short-channel compound FET's

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 45(8):1644-1652 Aug, 1998
Author: Babiker, S.
Asenov, A.
Cameron, N.
Beaumont, S.P.
Barker, J.R.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS 원문복사신청 - FRIC

Impact of Gate Recess Offset on Pseudomorphic HEMT Performance: A Simulation Study

회의자료

issue: ESSDERC '96: Proceedings of the 26th European Solid State Device Research Conference Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European. :1017-1020 Sep, 1996
Author: Asenov, A.
Babiker, S.
Cameron, N.
Taylor, M.R.S.
Beaumont, S.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

New Evidence for Velocity Overshoot in a 200 nm Pseudomorphic HEMT

회의자료

issue: ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European. :173-176 Sep, 1995
Author: Babiker, S.
Cameron, N.
Asenov, A.
Beaumont, S.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE)

Simple approach to include external resistances in the Monte Carlo simulation of MESFETs and HEMTs

학술저널

issue: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 43(11):2032-2034 Nov, 1996
Author: Babiker, S.
Asenov, A.
Cameron, N.
Beaumont, S.P.
DB Label: Database : IEEE Xplore Digital Library

원문보기: Full Text (IEEE) 조회 - Impact Factor (JCR) 등재 - Web of Science (SCIE) 등재 - SCOPUS 원문복사신청 - FRIC

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