전남대학교 중앙도서관

Status and Performance of Integration Modules Toward Scaled CMOS with Transition Metal Dichalcogenide Channel

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issue: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Author: Chou, Ang-Sheng
Hsu, Ching-Hao
Lin, Yu-Tung
Arutchelvan, Goutham
Chen, Edward
Hung, Terry Y.T.
Hsu, Chen-Feng
Chou, Sui-An
Lee, Tsung-En
Madia, Oreste
Doornbos, Gerben
Su, Yuan-Chun
Azizi, Amin
Sathaiya, D. Mahaveer
Cai, Jin
Wang, Jer-Fu
Chung, Yun-Yan
Wu, Wen-Chia
Neilson, Katie
Yun, Wei-Sheng
Hsu, Yu-Wei
Hsu, Ming-Chun
Hou, Fa-Rong
Shen, Yun-Yang
Chien, Chao-Hsin
Wu, Chung-Cheng
Wu, Jeff
Wong, H.-S. Philip
Chang, Wen-Hao
van Dal, Mark
Cheng, Chao-Ching
Wu, Chih-I
Radu, Iuliana P.
DB Label: Database : IEEE Xplore Digital Library

Scaled contact length with low contact resistance in monolayer 2D channel transistors

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issue: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Author: Wu, Wen-Chia
Hung, Terry Y.T.
Sathaiya, D. Mahaveer
Fan, Dongxu
Arutchelvan, Goutham
Hsu, Chen-Feng
Su, Sheng-Kai
Chou, Ang Sheng
Chen, Edward
Li, Weisheng
Yu, Zhihao
Qiu, Hao
Yang, Ying-Mei
Lin, Kuang-I
Shen, Yun-Yang
Chang, Wen-Hao
Liew, San Lin
Hou, Vincent
Cai, Jin
Wu, Chung-Cheng
Wu, Jeff
Philip Wong, H.-S.
Wang, Xinran
Chien, Chao-Hsin
Cheng, Chao-Ching
Radu, Iuliana P.
DB Label: Database : IEEE Xplore Digital Library

Channel Length Dependence of PBTI in High-k First RMG Gate Stack Integration Scheme

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issue: 2021 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2021 IEEE International. :1-4 Oct, 2021
Author: Parihar, Narendra
Arutchelvan, Goutham
Franco, Jacopo
Baudot, Sylvain
Opedebeeck, Ann
Demuynck, Steven
Arimura, Hiroaki
Ragnarsson, Lars-Ake
Mitard, Jerome
De Heyn, Vincent
Mercha, Abdelkarim
DB Label: Database : IEEE Xplore Digital Library

Contact Interface Characterization of Graphene contacted MoS2 FETs

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issue: 2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021
Author: Mootheri, Vivek
Minj, Albert
Arutchelvan, Goutham
Leonhardt, Alessandra
Asselberghs, Inge
Heyns, Marc
Radu, Iuliana
Lin, Dennis
DB Label: Database : IEEE Xplore Digital Library

Device and Circuit Level Gate Configuration Optimization for 2D Material Field-Effect Transistors

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issue: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2019 International Conference on. :1-4 Sep, 2019
Author: Verreck, Devin
Arutchelvan, Goutham
Heyns, Marc M.
Radu, Iuliana P.
DB Label: Database : IEEE Xplore Digital Library

Extreme scaling enabled by MX2 transistors: variability challenges (invited)

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issue: 2021 Silicon Nanoelectronics Workshop (SNW) Silicon Nanoelectronics Workshop (SNW), 2021. :1-2 Jun, 2021
Author: Smets, Quentin
Arutchelvan, Goutham
Schram, Tom
Verreck, Devin
Groven, Benjamin
Cott, Daire
Ahmed, Zubair
Shi, Yuanyuan
Sutar, Surajit
Mehta, Ankit Nalin
Lin, Dennis
Asselberghs, Inge
Radu, Iuliana
DB Label: Database : IEEE Xplore Digital Library

Interconnect-Device Co-Optimization for Field-Effect Transistors with Two-Dimensional Materials

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issue: 2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :73-75 Jun, 2018
Author: Verreck, Devin
Arutchelvan, Goutham
Ciofi, Ivan
Heyns, Marc M.
Radu, Iuliana P.
DB Label: Database : IEEE Xplore Digital Library